Intrinsic relationship between electronic structures and phase transition of SrBi2-xNdxNb2O9 ceramics from ultraviolet ellipsometry at elevated temperatures

  • Z. H. Duan
  • , K. Jiang
  • , L. P. Xu
  • , Y. W. Li
  • , Z. G. Hu*
  • , J. H. Chu
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

13 Scopus citations

Abstract

The ferroelectric orthorhombic to paraelectric tetragonal phase transition of SrBi2-xNdxNb2O9 (x = 0, 0.05, 0.1, and 0.2) layer-structured ceramics has been investigated by temperature-dependent spectroscopic ellipsometry. Based on the analysis of dielectric functions from 0 to 500 °C with double Tauc-Lorentz dispersion model, the interband transitions located at ultraviolet region have shown an abrupt variation near the Curie temperature. The changes of dielectric functions are mainly due to the thermal-optical and/or photoelastic effect. Moreover, the characteristic alteration in interband transitions can be ascribed to distortion of NbO6 octahedron and variation of hybridization between Bi 6s and O 2p states during the structure transformation.

Original languageEnglish
Article number054107
JournalJournal of Applied Physics
Volume115
Issue number5
DOIs
StatePublished - 7 Feb 2014

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