Interval Modeling for Gamma Process Degradation Model

  • Guihong Liu
  • , Qiang Guan*
  • , Yincai Tang
  • , Yunhuei Tzeng
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

9 Scopus citations

Abstract

In this paper, we proposed an interval degradation model to improve the reliability of the classical single point degradation model. The interval degradation model is very flexible when model parameters follows different distributions. Twenty-five types of interval Gamma degradation models are considered and discussed under different conditions. The reliabilities of interval Gamma degradation models are obtained. The Monte Carlo method has been studied to compute the reliability and lifetime of interval Gamma degradation model. The numerical examples are conducted to compare the interval degradation model with the classical single point degradation model. Simulation results reveal that the performance of reliability and mean lifetime of interval Gamma degradation model are much better than those of the single Gamma degradation model. Finally, we applied our model to a real data example and demonstrated the effectiveness and feasibility of the interval Gamma degradation model.

Original languageEnglish
Article number954
JournalSymmetry
Volume14
Issue number5
DOIs
StatePublished - May 2022

Keywords

  • Gamma process
  • degradation test
  • interval degradation model
  • reliability

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