Abstract
C60-based organic thin film transistors (OTFTs) with high electron mobility and high operational stability are achieved with (1 1 1) oriented C60 films grown by using template effects of diindenoperylene (DIP) under layer on the SiO2 gate insulator. The electron mobility of the C60 transistor is significantly increased from 0.21 cm2 V-1 s-1 to 2.92 cm2 V-1 s-1 by inserting the template-DIP layer. Moreover much higher operational stability is also observed for the DIP-template C 60 OTFTs. A grazing incidence X-ray diffraction and ultrahigh-sensitivity photoelectron spectroscopy measurements indicate that the improved electron mobility and stability arise from the decreased density of trap states in the C60 film due to increased (1 1 1) orientation of C60-grains and their crystallinity on the DIP template.
| Original language | English |
|---|---|
| Pages (from-to) | 2749-2755 |
| Number of pages | 7 |
| Journal | Organic Electronics |
| Volume | 15 |
| Issue number | 11 |
| DOIs | |
| State | Published - Nov 2014 |
| Externally published | Yes |
Keywords
- Electron mobility
- Grazing incidence X-ray diffraction
- Highly sensitive ultraviolet photoelectron spectroscopy
- Organic thin film transistor