Interface energetics at WOX/organic interfaces: The role of oxygen vacancies

  • Zheng Zhang
  • , Huai Xin Wei
  • , Guo Fu Ma
  • , Yan Qing Li*
  • , Shuit Tong Lee
  • , Jian Xin Tang
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

18 Scopus citations

Abstract

Oxygen vacancy in tungsten oxide (WOX) is critical to the interface energetics for charge injection and transport in organic electronic devices. Here, we systematically studied the impact of oxygen vacancy on electronic structures of the WOX/organic hole-transport layer interface via photoemission spectroscopy. The partial reduction of W cations and a decrease in its work function were observed by controlling the degree of oxygen vacancies in WOX with thermal annealing, which are due to the partial filling of the unoccupied 5d orbitals. The increase in oxygen deficiency caused the increase of hole-injection barrier at WOX/organic interfaces.

Original languageEnglish
Article number133302
JournalApplied Physics Letters
Volume103
Issue number13
DOIs
StatePublished - 23 Sep 2013
Externally publishedYes

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