Abstract
Graphene on SiO2 enables fabrication of Si-technology-compatible devices, but a transfer of these devices from other substrates and direct growth have severe limitations due to a relatively small grain size or device-contamination. Here, we show an efficient, transfer-free way to integrate centimeter-scale, single-crystal graphene, of a quality suitable for electronic devices, on an insulating SiO2 film. Starting with single-crystal graphene grown epitaxially on Ru(0001), a SiO2 film is grown under the graphene by stepwise intercalation of silicon and oxygen. Thin (∼1 nm) crystalline or thicker (∼2 nm) amorphous SiO2 has been produced. The insulating nature of the thick amorphous SiO2 is verified by transport measurements. The device-quality of the corresponding graphene was confirmed by the observation of Shubnikov-de Haas oscillations, an integer quantum Hall effect, and a weak antilocalization effect within in situ fabricated Hall bar devices. This work provides a reliable platform for applications of large-scale, high-quality graphene in electronics.
| Original language | English |
|---|---|
| Pages (from-to) | 8584-8591 |
| Number of pages | 8 |
| Journal | Nano Letters |
| Volume | 20 |
| Issue number | 12 |
| DOIs | |
| State | Published - 9 Dec 2020 |
| Externally published | Yes |
Keywords
- centimeter-scale
- graphene
- in situ device fabrication
- insulating SiO
- intercalation