Infrared spectroscopic elliposimetry and crystallization of manganese cobalt nickelate films prepared by chemical deposition at low temperature

Yu Jian Ge; Zhi Ming Huang; Yun Hou; Jian Huan Qin; Tian Xin Li; Jun Hao Chu

Infrared spectroscopic elliposimetry and crystallization of manganese cobalt nickelate films prepared by chemical deposition at low temperature

Yu Jian Ge^*
, Zhi Ming Huang
, Yun Hou
, Jian Huan Qin
, Tian Xin Li
, Jun Hao Chu

^*Corresponding author for this work

CAS - Shanghai Institute of Technical Physics

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

Manganese cobalt nickelate films (Mn_xCo_yNi_3-x-y) (MCN) were successfully prepared by chemical deposition method at the crystallization temperature of 600X1, which was greatly reduced from the traditional sintered temperature of 1050-1200°C. Our results show that the grain size of MCN films increases from 20 to 50 nm with the annealing temperature increasing from 600°C to 900°C. The real part ε₁ and imaginary part ε₂ of the dielectric constants and absorption coefficients of MCN thin films were determined by infrared spectroscopic ellipsometry (IRSE).

Original language	English
Pages (from-to)	413-416
Number of pages	4
Journal	Hongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves
Volume	27
Issue number	6
State	Published - Dec 2008
Externally published	Yes

Keywords

Atomic force microscopy
Infrared spectroscopic ellipsometry
X-ray diffraction

Cite this

@article{41a2dee2aa354fe7b5bfdfc1042d43e8,

title = "Infrared spectroscopic elliposimetry and crystallization of manganese cobalt nickelate films prepared by chemical deposition at low temperature",

abstract = "Manganese cobalt nickelate films (MnxCoyNi3-x-y) (MCN) were successfully prepared by chemical deposition method at the crystallization temperature of 600X1, which was greatly reduced from the traditional sintered temperature of 1050-1200°C. Our results show that the grain size of MCN films increases from 20 to 50 nm with the annealing temperature increasing from 600°C to 900°C. The real part ε1 and imaginary part ε2 of the dielectric constants and absorption coefficients of MCN thin films were determined by infrared spectroscopic ellipsometry (IRSE).",

keywords = "Atomic force microscopy, Infrared spectroscopic ellipsometry, X-ray diffraction",

author = "Ge, \{Yu Jian\} and Huang, \{Zhi Ming\} and Yun Hou and Qin, \{Jian Huan\} and Li, \{Tian Xin\} and Chu, \{Jun Hao\}",

year = "2008",

month = dec,

language = "英语",

volume = "27",

pages = "413--416",

journal = "Hongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves",

issn = "1001-9014",

publisher = "Chinese Optical Society",

number = "6",

}

TY - JOUR

T1 - Infrared spectroscopic elliposimetry and crystallization of manganese cobalt nickelate films prepared by chemical deposition at low temperature

AU - Ge, Yu Jian

AU - Huang, Zhi Ming

AU - Hou, Yun

AU - Qin, Jian Huan

AU - Li, Tian Xin

AU - Chu, Jun Hao

PY - 2008/12

Y1 - 2008/12

N2 - Manganese cobalt nickelate films (MnxCoyNi3-x-y) (MCN) were successfully prepared by chemical deposition method at the crystallization temperature of 600X1, which was greatly reduced from the traditional sintered temperature of 1050-1200°C. Our results show that the grain size of MCN films increases from 20 to 50 nm with the annealing temperature increasing from 600°C to 900°C. The real part ε1 and imaginary part ε2 of the dielectric constants and absorption coefficients of MCN thin films were determined by infrared spectroscopic ellipsometry (IRSE).

AB - Manganese cobalt nickelate films (MnxCoyNi3-x-y) (MCN) were successfully prepared by chemical deposition method at the crystallization temperature of 600X1, which was greatly reduced from the traditional sintered temperature of 1050-1200°C. Our results show that the grain size of MCN films increases from 20 to 50 nm with the annealing temperature increasing from 600°C to 900°C. The real part ε1 and imaginary part ε2 of the dielectric constants and absorption coefficients of MCN thin films were determined by infrared spectroscopic ellipsometry (IRSE).

KW - Atomic force microscopy

KW - Infrared spectroscopic ellipsometry

KW - X-ray diffraction

UR - https://www.scopus.com/pages/publications/57949088169

M3 - 文章

AN - SCOPUS:57949088169

SN - 1001-9014

VL - 27

SP - 413

EP - 416

JO - Hongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves

JF - Hongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves

IS - 6

ER -

Infrared spectroscopic elliposimetry and crystallization of manganese cobalt nickelate films prepared by chemical deposition at low temperature

Abstract

Keywords

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