Infrared optical properties of sol-gel Pb1-xLa xTiO3 ferroelectric thin films

F. W. Shi; Z. G. Hu; G. S. Wang; T. Lin; J. H. Ma; Z. M. Huang; X. J. Meng; J. L. Sun; J. H. Chu

doi:10.1016/j.tsf.2003.09.059

Infrared optical properties of sol-gel Pb_1-xLa _xTiO₃ ferroelectric thin films

F. W. Shi^*
, Z. G. Hu
, G. S. Wang
, T. Lin
, J. H. Ma
, Z. M. Huang
, X. J. Meng
, J. L. Sun
, J. H. Chu

^*Corresponding author for this work

CAS - Shanghai Institute of Technical Physics

Research output: Contribution to journal › Article › peer-review

8 Scopus citations

Abstract

The Pb_1-xLa_xTiO₃ (PLT) ferroelectric thin films on Pt/Ti/SiO₂/Si(1 0 0) substrates were fabricated by a sol-gel process. The infrared optical properties of PLT thin films with x=0.1, 0.2, 0.25 on platinized silicon Pt(1 1 1)/Ti/SiO₂/Si(1 0 0) substrates were studied by infrared spectroscopic ellipsometry (IRSE) technique in the wavelength region from 2.5 to 12.6 μm. The infrared optical constants were obtained by fitting the IRSE data using a classical dielectric function model. The refractive index increases, and the extinction coefficient decreases as wavenumber increases in the measured infrared region. The refractive index of PLT thin films decreases as the La contents increase in the films.

Original language	English
Pages (from-to)	223-226
Number of pages	4
Journal	Thin Solid Films
Volume	458
Issue number	1-2
DOIs	https://doi.org/10.1016/j.tsf.2003.09.059
State	Published - 30 Jun 2004
Externally published	Yes

Keywords

Ferroelectric thin films
Optical properties
Sol-gel
Spectroscopic ellipsometry

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10.1016/j.tsf.2003.09.059

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@article{a080449f3c1c493e91398ca0580a9407,

title = "Infrared optical properties of sol-gel Pb1-xLa xTiO3 ferroelectric thin films",

abstract = "The Pb1-xLaxTiO3 (PLT) ferroelectric thin films on Pt/Ti/SiO2/Si(1 0 0) substrates were fabricated by a sol-gel process. The infrared optical properties of PLT thin films with x=0.1, 0.2, 0.25 on platinized silicon Pt(1 1 1)/Ti/SiO2/Si(1 0 0) substrates were studied by infrared spectroscopic ellipsometry (IRSE) technique in the wavelength region from 2.5 to 12.6 μm. The infrared optical constants were obtained by fitting the IRSE data using a classical dielectric function model. The refractive index increases, and the extinction coefficient decreases as wavenumber increases in the measured infrared region. The refractive index of PLT thin films decreases as the La contents increase in the films.",

keywords = "Ferroelectric thin films, Optical properties, Sol-gel, Spectroscopic ellipsometry",

author = "Shi, \{F. W.\} and Hu, \{Z. G.\} and Wang, \{G. S.\} and T. Lin and Ma, \{J. H.\} and Huang, \{Z. M.\} and Meng, \{X. J.\} and Sun, \{J. L.\} and Chu, \{J. H.\}",

year = "2004",

month = jun,

day = "30",

doi = "10.1016/j.tsf.2003.09.059",

language = "英语",

volume = "458",

pages = "223--226",

journal = "Thin Solid Films",

issn = "0040-6090",

publisher = "Elsevier B.V.",

number = "1-2",

}

TY - JOUR

T1 - Infrared optical properties of sol-gel Pb1-xLa xTiO3 ferroelectric thin films

AU - Shi, F. W.

AU - Hu, Z. G.

AU - Wang, G. S.

AU - Lin, T.

AU - Ma, J. H.

AU - Huang, Z. M.

AU - Meng, X. J.

AU - Sun, J. L.

AU - Chu, J. H.

PY - 2004/6/30

Y1 - 2004/6/30

N2 - The Pb1-xLaxTiO3 (PLT) ferroelectric thin films on Pt/Ti/SiO2/Si(1 0 0) substrates were fabricated by a sol-gel process. The infrared optical properties of PLT thin films with x=0.1, 0.2, 0.25 on platinized silicon Pt(1 1 1)/Ti/SiO2/Si(1 0 0) substrates were studied by infrared spectroscopic ellipsometry (IRSE) technique in the wavelength region from 2.5 to 12.6 μm. The infrared optical constants were obtained by fitting the IRSE data using a classical dielectric function model. The refractive index increases, and the extinction coefficient decreases as wavenumber increases in the measured infrared region. The refractive index of PLT thin films decreases as the La contents increase in the films.

AB - The Pb1-xLaxTiO3 (PLT) ferroelectric thin films on Pt/Ti/SiO2/Si(1 0 0) substrates were fabricated by a sol-gel process. The infrared optical properties of PLT thin films with x=0.1, 0.2, 0.25 on platinized silicon Pt(1 1 1)/Ti/SiO2/Si(1 0 0) substrates were studied by infrared spectroscopic ellipsometry (IRSE) technique in the wavelength region from 2.5 to 12.6 μm. The infrared optical constants were obtained by fitting the IRSE data using a classical dielectric function model. The refractive index increases, and the extinction coefficient decreases as wavenumber increases in the measured infrared region. The refractive index of PLT thin films decreases as the La contents increase in the films.

KW - Ferroelectric thin films

KW - Optical properties

KW - Sol-gel

KW - Spectroscopic ellipsometry

UR - https://www.scopus.com/pages/publications/2542460589

U2 - 10.1016/j.tsf.2003.09.059

DO - 10.1016/j.tsf.2003.09.059

M3 - 文章

AN - SCOPUS:2542460589

SN - 0040-6090

VL - 458

SP - 223

EP - 226

JO - Thin Solid Films

JF - Thin Solid Films

IS - 1-2

ER -

Infrared optical properties of sol-gel Pb_1-xLa _xTiO₃ ferroelectric thin films

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Keywords

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