Infrared optical properties of PbZr0.4Ti0.6O 3/La0.5Sr0.5CoO3 heterostructures on platinized silicon substrate

  • G. S. Wang*
  • , Z. G. Hu
  • , Z. M. Huang
  • , J. Yu
  • , F. W. Shi
  • , T. Lin
  • , J. H. Ma
  • , Q. Zhao
  • , J. L. Sun
  • , X. J. Meng
  • , S. L. Guo
  • , J. H. Chu
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

PbZr0.4Ti0.6O3/La0.5Sr 0.5CoO3 heterostructures have been grown on Pt/Ti/SiO 2/Si substrates by chemical solution routes. Optical properties of the PbZr0.4Ti0.6O3/La0.5Sr 0.5CoO3 heterostructures were studied by infrared spectroscopic ellipsometry (IRSE) in the spectral range of 2.5-12.5 μm. The optical constants of PbZr0.4Ti0.6O3 and La 0.5Sr0.5CoO3 thin films were determined by fitting the IRSE data using a classical dielectric model and a Drude dielectric model, respectively. For PbZr0.4Ti0.6O3 thin films, the refractive index decreases and the extinction coefficient increases as the wavelength increases. For La0.5Sr0.5CoO 3 thin films, the refractive index and the extinction coefficient increase as the wavelength increases. The absorption coefficient of La 0.5Sr0.5CoO3 thin films is greater than 10 4 cm-1 for the wavelength range of 2.5-12.5 μm. The absorption coefficient of PbZr0.4Ti0.6O3 thin films on a La0.5Sr0.5CoO3/Pt/Ti/SiO 2/Si substrate is smaller than that on a Pt/Ti/SiO2/Si substrate by a factor of two.

Original languageEnglish
Pages (from-to)119-123
Number of pages5
JournalApplied Physics A: Materials Science and Processing
Volume78
Issue number1
DOIs
StatePublished - Jan 2004
Externally publishedYes

Fingerprint

Dive into the research topics of 'Infrared optical properties of PbZr0.4Ti0.6O 3/La0.5Sr0.5CoO3 heterostructures on platinized silicon substrate'. Together they form a unique fingerprint.

Cite this