Abstract
PbZr0.4Ti0.6O3/La0.5Sr 0.5CoO3 heterostructures have been grown on Pt/Ti/SiO 2/Si substrates by chemical solution routes. Optical properties of the PbZr0.4Ti0.6O3/La0.5Sr 0.5CoO3 heterostructures were studied by infrared spectroscopic ellipsometry (IRSE) in the spectral range of 2.5-12.5 μm. The optical constants of PbZr0.4Ti0.6O3 and La 0.5Sr0.5CoO3 thin films were determined by fitting the IRSE data using a classical dielectric model and a Drude dielectric model, respectively. For PbZr0.4Ti0.6O3 thin films, the refractive index decreases and the extinction coefficient increases as the wavelength increases. For La0.5Sr0.5CoO 3 thin films, the refractive index and the extinction coefficient increase as the wavelength increases. The absorption coefficient of La 0.5Sr0.5CoO3 thin films is greater than 10 4 cm-1 for the wavelength range of 2.5-12.5 μm. The absorption coefficient of PbZr0.4Ti0.6O3 thin films on a La0.5Sr0.5CoO3/Pt/Ti/SiO 2/Si substrate is smaller than that on a Pt/Ti/SiO2/Si substrate by a factor of two.
| Original language | English |
|---|---|
| Pages (from-to) | 119-123 |
| Number of pages | 5 |
| Journal | Applied Physics A: Materials Science and Processing |
| Volume | 78 |
| Issue number | 1 |
| DOIs | |
| State | Published - Jan 2004 |
| Externally published | Yes |
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