Infrared optical properties of BiFeO3 thin films prepared by chemical solution deposition

Y. W. Li; J. Q. Xue; J. L. Sun; X. J. Meng; Z. M. Huang; J. H. Chu; L. H. Ding; W. F. Zhang

doi:10.1007/s00339-006-3855-y

Infrared optical properties of BiFeO₃ thin films prepared by chemical solution deposition

Y. W. Li
, J. Q. Xue
, J. L. Sun
, X. J. Meng
, Z. M. Huang
, J. H. Chu
, L. H. Ding
, W. F. Zhang^*

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Abstract

BiFeO₃ thin films have been grown on Pt(111)/Ti/SiO ₂/Si substrates by chemical solution deposition. It is shown that the films are polycrystalline by the measurement of X-ray diffraction. The infrared optical properties of BiFeO₃ thin films have been investigated using the infrared spectroscopic ellipsometry in the wavelength range of 2.5 to 12.6 μm. The infrared optical constants of the BiFeO₃ thin films are obtained by fitting the measured ellipsometric spectra data using a three-medium model and a classical dielectric function model. The absorption coefficient of BiFeO₃ thin films is greater than 100 cm^-1 in total measured wavelength region and greater than 1000 cm^-1 at the wavelength region above 7.5 μm. It is bigger than that of PbTiO₃, Pb(Zr,Ti)O₃ and (Pb,La)(Zr,Ti)O₃ thin films. It indicates that the BiFeO₃ thin films are excellent candidates for infrared detectors.

Original language	English
Pages (from-to)	125-128
Number of pages	4
Journal	Applied Physics A: Materials Science and Processing
Volume	87
Issue number	1
DOIs	https://doi.org/10.1007/s00339-006-3855-y
State	Published - Apr 2007
Externally published	Yes

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title = "Infrared optical properties of BiFeO3 thin films prepared by chemical solution deposition",

abstract = "BiFeO3 thin films have been grown on Pt(111)/Ti/SiO 2/Si substrates by chemical solution deposition. It is shown that the films are polycrystalline by the measurement of X-ray diffraction. The infrared optical properties of BiFeO3 thin films have been investigated using the infrared spectroscopic ellipsometry in the wavelength range of 2.5 to 12.6 μm. The infrared optical constants of the BiFeO3 thin films are obtained by fitting the measured ellipsometric spectra data using a three-medium model and a classical dielectric function model. The absorption coefficient of BiFeO3 thin films is greater than 100 cm-1 in total measured wavelength region and greater than 1000 cm-1 at the wavelength region above 7.5 μm. It is bigger than that of PbTiO3, Pb(Zr,Ti)O3 and (Pb,La)(Zr,Ti)O3 thin films. It indicates that the BiFeO3 thin films are excellent candidates for infrared detectors.",

author = "Li, \{Y. W.\} and Xue, \{J. Q.\} and Sun, \{J. L.\} and Meng, \{X. J.\} and Huang, \{Z. M.\} and Chu, \{J. H.\} and Ding, \{L. H.\} and Zhang, \{W. F.\}",

year = "2007",

month = apr,

doi = "10.1007/s00339-006-3855-y",

language = "英语",

volume = "87",

pages = "125--128",

journal = "Applied Physics A: Materials Science and Processing",

issn = "0947-8396",

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TY - JOUR

T1 - Infrared optical properties of BiFeO3 thin films prepared by chemical solution deposition

AU - Li, Y. W.

AU - Xue, J. Q.

AU - Sun, J. L.

AU - Meng, X. J.

AU - Huang, Z. M.

AU - Chu, J. H.

AU - Ding, L. H.

AU - Zhang, W. F.

PY - 2007/4

Y1 - 2007/4

N2 - BiFeO3 thin films have been grown on Pt(111)/Ti/SiO 2/Si substrates by chemical solution deposition. It is shown that the films are polycrystalline by the measurement of X-ray diffraction. The infrared optical properties of BiFeO3 thin films have been investigated using the infrared spectroscopic ellipsometry in the wavelength range of 2.5 to 12.6 μm. The infrared optical constants of the BiFeO3 thin films are obtained by fitting the measured ellipsometric spectra data using a three-medium model and a classical dielectric function model. The absorption coefficient of BiFeO3 thin films is greater than 100 cm-1 in total measured wavelength region and greater than 1000 cm-1 at the wavelength region above 7.5 μm. It is bigger than that of PbTiO3, Pb(Zr,Ti)O3 and (Pb,La)(Zr,Ti)O3 thin films. It indicates that the BiFeO3 thin films are excellent candidates for infrared detectors.

AB - BiFeO3 thin films have been grown on Pt(111)/Ti/SiO 2/Si substrates by chemical solution deposition. It is shown that the films are polycrystalline by the measurement of X-ray diffraction. The infrared optical properties of BiFeO3 thin films have been investigated using the infrared spectroscopic ellipsometry in the wavelength range of 2.5 to 12.6 μm. The infrared optical constants of the BiFeO3 thin films are obtained by fitting the measured ellipsometric spectra data using a three-medium model and a classical dielectric function model. The absorption coefficient of BiFeO3 thin films is greater than 100 cm-1 in total measured wavelength region and greater than 1000 cm-1 at the wavelength region above 7.5 μm. It is bigger than that of PbTiO3, Pb(Zr,Ti)O3 and (Pb,La)(Zr,Ti)O3 thin films. It indicates that the BiFeO3 thin films are excellent candidates for infrared detectors.

UR - https://www.scopus.com/pages/publications/33847194698

U2 - 10.1007/s00339-006-3855-y

DO - 10.1007/s00339-006-3855-y

M3 - 文章

AN - SCOPUS:33847194698

SN - 0947-8396

VL - 87

SP - 125

EP - 128

JO - Applied Physics A: Materials Science and Processing

JF - Applied Physics A: Materials Science and Processing

IS - 1

ER -

Infrared optical properties of BiFeO₃ thin films prepared by chemical solution deposition

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