Infrared ellipsometric spectroscopy of Mn1.56Co0.96Ni0.48O4 thin films with different layers

Yanqing Gao; Zhiming Huang; Yun Hou; Jing Wu; Wei Zhou; Cheng Ouyang; Junhao Chu

doi:10.1109/IRMMW-THz.2015.7327441

Infrared ellipsometric spectroscopy of Mn_1.56Co_0.96Ni_0.48O₄ thin films with different layers

Yanqing Gao
, Zhiming Huang
, Yun Hou
, Jing Wu
, Wei Zhou
, Cheng Ouyang
, Junhao Chu

CAS - Shanghai Institute of Technical Physics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

High quality Mn_1.56Co_0.96Ni_0.48O₄ films with different layers have been prepared on Pt//Ti/SiO₂/Si substrate. Infrared optical properties of the films have been investigated using infrared spectroscopic ellipsometry. The optical constants have been obtained by fitting the measured ellipsometric parameter data with classical infrared model.

Original language	English
Title of host publication	IRMMW-THz 2015 - 40th International Conference on Infrared, Millimeter, and Terahertz Waves
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781479982721
DOIs	https://doi.org/10.1109/IRMMW-THz.2015.7327441
State	Published - 11 Nov 2015
Externally published	Yes
Event	40th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2015 - Hong Kong, China Duration: 23 Aug 2015 → 28 Aug 2015

Publication series

Name	IRMMW-THz 2015 - 40th International Conference on Infrared, Millimeter, and Terahertz Waves

Conference

Conference	40th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2015
Country/Territory	China
City	Hong Kong
Period	23/08/15 → 28/08/15

Access to Document

10.1109/IRMMW-THz.2015.7327441

Cite this

Gao, Y., Huang, Z., Hou, Y., Wu, J., Zhou, W., Ouyang, C., & Chu, J. (2015). Infrared ellipsometric spectroscopy of Mn_1.56Co_0.96Ni_0.48O₄ thin films with different layers. In IRMMW-THz 2015 - 40th International Conference on Infrared, Millimeter, and Terahertz Waves Article 7327441 (IRMMW-THz 2015 - 40th International Conference on Infrared, Millimeter, and Terahertz Waves). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IRMMW-THz.2015.7327441

Gao, Yanqing ; Huang, Zhiming ; Hou, Yun et al. / Infrared ellipsometric spectroscopy of Mn_1.56Co_0.96Ni_0.48O₄ thin films with different layers. IRMMW-THz 2015 - 40th International Conference on Infrared, Millimeter, and Terahertz Waves. Institute of Electrical and Electronics Engineers Inc., 2015. (IRMMW-THz 2015 - 40th International Conference on Infrared, Millimeter, and Terahertz Waves).

@inproceedings{110626d7bede4063a368553ccd6e1a4d,

title = "Infrared ellipsometric spectroscopy of Mn1.56Co0.96Ni0.48O4 thin films with different layers",

abstract = "High quality Mn1.56Co0.96Ni0.48O4 films with different layers have been prepared on Pt//Ti/SiO2/Si substrate. Infrared optical properties of the films have been investigated using infrared spectroscopic ellipsometry. The optical constants have been obtained by fitting the measured ellipsometric parameter data with classical infrared model.",

author = "Yanqing Gao and Zhiming Huang and Yun Hou and Jing Wu and Wei Zhou and Cheng Ouyang and Junhao Chu",

note = "Publisher Copyright: {\textcopyright} 2015 IEEE.; 40th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2015 ; Conference date: 23-08-2015 Through 28-08-2015",

year = "2015",

month = nov,

day = "11",

doi = "10.1109/IRMMW-THz.2015.7327441",

language = "英语",

series = "IRMMW-THz 2015 - 40th International Conference on Infrared, Millimeter, and Terahertz Waves",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "IRMMW-THz 2015 - 40th International Conference on Infrared, Millimeter, and Terahertz Waves",

address = "美国",

}

Gao, Y, Huang, Z, Hou, Y, Wu, J, Zhou, W, Ouyang, C & Chu, J 2015, Infrared ellipsometric spectroscopy of Mn_1.56Co_0.96Ni_0.48O₄ thin films with different layers. in IRMMW-THz 2015 - 40th International Conference on Infrared, Millimeter, and Terahertz Waves., 7327441, IRMMW-THz 2015 - 40th International Conference on Infrared, Millimeter, and Terahertz Waves, Institute of Electrical and Electronics Engineers Inc., 40th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2015, Hong Kong, China, 23/08/15. https://doi.org/10.1109/IRMMW-THz.2015.7327441

Infrared ellipsometric spectroscopy of Mn_1.56Co_0.96Ni_0.48O₄ thin films with different layers. / Gao, Yanqing; Huang, Zhiming; Hou, Yun et al.
IRMMW-THz 2015 - 40th International Conference on Infrared, Millimeter, and Terahertz Waves. Institute of Electrical and Electronics Engineers Inc., 2015. 7327441 (IRMMW-THz 2015 - 40th International Conference on Infrared, Millimeter, and Terahertz Waves).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Infrared ellipsometric spectroscopy of Mn1.56Co0.96Ni0.48O4 thin films with different layers

AU - Gao, Yanqing

AU - Huang, Zhiming

AU - Hou, Yun

AU - Wu, Jing

AU - Zhou, Wei

AU - Ouyang, Cheng

AU - Chu, Junhao

PY - 2015/11/11

Y1 - 2015/11/11

N2 - High quality Mn1.56Co0.96Ni0.48O4 films with different layers have been prepared on Pt//Ti/SiO2/Si substrate. Infrared optical properties of the films have been investigated using infrared spectroscopic ellipsometry. The optical constants have been obtained by fitting the measured ellipsometric parameter data with classical infrared model.

AB - High quality Mn1.56Co0.96Ni0.48O4 films with different layers have been prepared on Pt//Ti/SiO2/Si substrate. Infrared optical properties of the films have been investigated using infrared spectroscopic ellipsometry. The optical constants have been obtained by fitting the measured ellipsometric parameter data with classical infrared model.

UR - https://www.scopus.com/pages/publications/84969160150

U2 - 10.1109/IRMMW-THz.2015.7327441

DO - 10.1109/IRMMW-THz.2015.7327441

M3 - 会议稿件

AN - SCOPUS:84969160150

T3 - IRMMW-THz 2015 - 40th International Conference on Infrared, Millimeter, and Terahertz Waves

BT - IRMMW-THz 2015 - 40th International Conference on Infrared, Millimeter, and Terahertz Waves

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 40th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2015

Y2 - 23 August 2015 through 28 August 2015

ER -

Gao Y, Huang Z, Hou Y, Wu J, Zhou W, Ouyang C et al. Infrared ellipsometric spectroscopy of Mn_1.56Co_0.96Ni_0.48O₄ thin films with different layers. In IRMMW-THz 2015 - 40th International Conference on Infrared, Millimeter, and Terahertz Waves. Institute of Electrical and Electronics Engineers Inc. 2015. 7327441. (IRMMW-THz 2015 - 40th International Conference on Infrared, Millimeter, and Terahertz Waves). doi: 10.1109/IRMMW-THz.2015.7327441