Influence of transition elements doping on structural, optical and magnetic properties of BiFeO3 films fabricated by magnetron sputtering

Hurui Yan; Hongmei Deng; Nuofan Ding; Jun He; Lin Peng; Lin Sun; Pingxiong Yang; Junhao Chu

doi:10.1016/j.matlet.2013.08.075

Influence of transition elements doping on structural, optical and magnetic properties of BiFeO₃ films fabricated by magnetron sputtering

Hurui Yan, Hongmei Deng, Nuofan Ding, Jun He, Lin Peng, Lin Sun, Pingxiong Yang, Junhao Chu

School of Physics and Electronic Science

Research output: Contribution to journal › Article › peer-review

41 Scopus citations

Abstract

Bi_0.9La_0.1Fe_1-xCr_xO₃ (x=0.03, 0.05 and 0.07) thin films were deposited on LaNiO₃/Si and quartz by RF magnetron sputtering, respectively. X-ray diffraction patterns indicate that all phases belong to BiFeO₃, and no secondary phase is detected. Three A₁ modes and six E modes of the films are observed in Raman scattering spectra, and the A₁-1 peak position shows red shift with the increasing of x, which indicates that the Cr doping induces more structural distortion. The band gap of the films for x=0.03, 0.05 and 0.07 can be expressed by (2.99-x) eV, which is due to the Cr doping that increases the tailing of conduction band edge into the band gap. With the Cr content increasing from 3% to 7%, the remnant magnetization and the magnetization at 10 kOe of the films show about 202% and 55% addition, respectively.

Original language	English
Pages (from-to)	123-125
Number of pages	3
Journal	Materials Letters
Volume	111
DOIs	https://doi.org/10.1016/j.matlet.2013.08.075
State	Published - 2013

Keywords

BiFeO
Ferroelectrics
Magnetic properties
Optical properties
Thin films

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10.1016/j.matlet.2013.08.075

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@article{f784791e085247fab5de7b2faf91eeec,

title = "Influence of transition elements doping on structural, optical and magnetic properties of BiFeO3 films fabricated by magnetron sputtering",

abstract = "Bi0.9La0.1Fe1-xCrxO3 (x=0.03, 0.05 and 0.07) thin films were deposited on LaNiO3/Si and quartz by RF magnetron sputtering, respectively. X-ray diffraction patterns indicate that all phases belong to BiFeO3, and no secondary phase is detected. Three A1 modes and six E modes of the films are observed in Raman scattering spectra, and the A1-1 peak position shows red shift with the increasing of x, which indicates that the Cr doping induces more structural distortion. The band gap of the films for x=0.03, 0.05 and 0.07 can be expressed by (2.99-x) eV, which is due to the Cr doping that increases the tailing of conduction band edge into the band gap. With the Cr content increasing from 3\% to 7\%, the remnant magnetization and the magnetization at 10 kOe of the films show about 202\% and 55\% addition, respectively.",

keywords = "BiFeO, Ferroelectrics, Magnetic properties, Optical properties, Thin films",

author = "Hurui Yan and Hongmei Deng and Nuofan Ding and Jun He and Lin Peng and Lin Sun and Pingxiong Yang and Junhao Chu",

year = "2013",

doi = "10.1016/j.matlet.2013.08.075",

language = "英语",

volume = "111",

pages = "123--125",

journal = "Materials Letters",

issn = "0167-577X",

publisher = "Elsevier B.V.",

}

TY - JOUR

T1 - Influence of transition elements doping on structural, optical and magnetic properties of BiFeO3 films fabricated by magnetron sputtering

AU - Yan, Hurui

AU - Deng, Hongmei

AU - Ding, Nuofan

AU - He, Jun

AU - Peng, Lin

AU - Sun, Lin

AU - Yang, Pingxiong

AU - Chu, Junhao

PY - 2013

Y1 - 2013

N2 - Bi0.9La0.1Fe1-xCrxO3 (x=0.03, 0.05 and 0.07) thin films were deposited on LaNiO3/Si and quartz by RF magnetron sputtering, respectively. X-ray diffraction patterns indicate that all phases belong to BiFeO3, and no secondary phase is detected. Three A1 modes and six E modes of the films are observed in Raman scattering spectra, and the A1-1 peak position shows red shift with the increasing of x, which indicates that the Cr doping induces more structural distortion. The band gap of the films for x=0.03, 0.05 and 0.07 can be expressed by (2.99-x) eV, which is due to the Cr doping that increases the tailing of conduction band edge into the band gap. With the Cr content increasing from 3% to 7%, the remnant magnetization and the magnetization at 10 kOe of the films show about 202% and 55% addition, respectively.

AB - Bi0.9La0.1Fe1-xCrxO3 (x=0.03, 0.05 and 0.07) thin films were deposited on LaNiO3/Si and quartz by RF magnetron sputtering, respectively. X-ray diffraction patterns indicate that all phases belong to BiFeO3, and no secondary phase is detected. Three A1 modes and six E modes of the films are observed in Raman scattering spectra, and the A1-1 peak position shows red shift with the increasing of x, which indicates that the Cr doping induces more structural distortion. The band gap of the films for x=0.03, 0.05 and 0.07 can be expressed by (2.99-x) eV, which is due to the Cr doping that increases the tailing of conduction band edge into the band gap. With the Cr content increasing from 3% to 7%, the remnant magnetization and the magnetization at 10 kOe of the films show about 202% and 55% addition, respectively.

KW - BiFeO

KW - Ferroelectrics

KW - Magnetic properties

KW - Optical properties

KW - Thin films

UR - https://www.scopus.com/pages/publications/84883708299

U2 - 10.1016/j.matlet.2013.08.075

DO - 10.1016/j.matlet.2013.08.075

M3 - 文章

AN - SCOPUS:84883708299

SN - 0167-577X

VL - 111

SP - 123

EP - 125

JO - Materials Letters

JF - Materials Letters

ER -

Influence of transition elements doping on structural, optical and magnetic properties of BiFeO₃ films fabricated by magnetron sputtering

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Keywords

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