Abstract
Scanning electron microscope (SEM), energy dispersive X-ray analysis (EDX) and X-ray double-crystal rocking curve (DCRC) were used to study CdTe or CdZnTe substrates and Hg1-x CdxTe liquid phase epitaxial (LPE) film. The results show that the morphology and quality of epitaxial-films depend upon substrate quality, substrate preparation and growth conditions. The quality substrate without grain boundary is the prerequisite for production of perfect epitaxial-films. A protected coverage on meltback LPE growth mode would be helpful to improve surface morphology and quality
| Original language | English |
|---|---|
| Pages (from-to) | 518-521 |
| Number of pages | 4 |
| Journal | Gongneng Cailiao/Journal of Functional Materials |
| Volume | 27 |
| Issue number | 6 |
| State | Published - 1 Jan 1996 |
| Externally published | Yes |