Influence of substitution of Nd3+ for Bi3+ on structure and piezoelectric properties of SrBi2-χNdχNb2O9 (χ=0, 0.1, 0.2 and 0.4)

Lin SUN; Jun hao CHU; Ping xiong YANG; Fang yu YUE; Ya wei LI; Chu de FENG; Cao liang MAO

doi:10.1016/S1003-6326(09)60051-0

Influence of substitution of Nd³⁺ for Bi³⁺ on structure and piezoelectric properties of SrBi_2-χNd_χNb₂O₉ (χ=0, 0.1, 0.2 and 0.4)

Lin SUN, Jun hao CHU, Ping xiong YANG, Fang yu YUE, Ya wei LI, Chu de FENG, Cao liang MAO

School of Physics and Electronic Science

Research output: Contribution to journal › Article › peer-review

18 Scopus citations

Abstract

SrBi_2-χNd_χNb₂O₉ (χ=0, 0.1, 0.2 and 0.4) bismuth layer-structured ferroelectric ceramics were prepared by the solid-state reaction sintering method. The accurate position of Nd element in SrBi_2-χNd_χNb₂O₉ ceramics was determined by the X-ray Rietveld method and Synchrotron radiation X-ray absorption fine structure (XAFS) technology. The partial substitution of Nd³⁺ for Bi³⁺ leads to the decrease in the distortion of NbO₆ octahedron for SrBi_2-χNd_χNb₂O₉ ceramics and also lowers the piezoelectric properties of SrBi_2-χNd_χNb₂O₉ ceramics. Meanwhile, the temperature coefficient of resonant frequency (TCF) decreases when Nd element partially replaces Bi element in SrBi_2-χNd_χNb₂O₉ ceramics.

Original language	English
Pages (from-to)	1459-1463
Number of pages	5
Journal	Transactions of Nonferrous Metals Society of China (English Edition)
Volume	19
Issue number	6
DOIs	https://doi.org/10.1016/S1003-6326(09)60051-0
State	Published - Dec 2009

Keywords

X-ray Rietveld method
bismuth layer-structured ferroelectrics
piezoelectric properties
synchrotron radiation XAFS

Access to Document

10.1016/S1003-6326(09)60051-0

Cite this

@article{2935661ecca9464e89721d45992f1d61,

title = "Influence of substitution of Nd3+ for Bi3+ on structure and piezoelectric properties of SrBi2-χNdχNb2O9 (χ=0, 0.1, 0.2 and 0.4)",

abstract = "SrBi2-χNdχNb2O9 (χ=0, 0.1, 0.2 and 0.4) bismuth layer-structured ferroelectric ceramics were prepared by the solid-state reaction sintering method. The accurate position of Nd element in SrBi2-χNdχNb2O9 ceramics was determined by the X-ray Rietveld method and Synchrotron radiation X-ray absorption fine structure (XAFS) technology. The partial substitution of Nd3+ for Bi3+ leads to the decrease in the distortion of NbO6 octahedron for SrBi2-χNdχNb2O9 ceramics and also lowers the piezoelectric properties of SrBi2-χNdχNb2O9 ceramics. Meanwhile, the temperature coefficient of resonant frequency (TCF) decreases when Nd element partially replaces Bi element in SrBi2-χNdχNb2O9 ceramics.",

keywords = "X-ray Rietveld method, bismuth layer-structured ferroelectrics, piezoelectric properties, synchrotron radiation XAFS",

author = "Lin SUN and CHU, \{Jun hao\} and YANG, \{Ping xiong\} and YUE, \{Fang yu\} and LI, \{Ya wei\} and FENG, \{Chu de\} and MAO, \{Cao liang\}",

year = "2009",

month = dec,

doi = "10.1016/S1003-6326(09)60051-0",

language = "英语",

volume = "19",

pages = "1459--1463",

journal = "Transactions of Nonferrous Metals Society of China (English Edition)",

issn = "1003-6326",

publisher = "Nonferrous Metals Society of China",

number = "6",

}

TY - JOUR

T1 - Influence of substitution of Nd3+ for Bi3+ on structure and piezoelectric properties of SrBi2-χNdχNb2O9 (χ=0, 0.1, 0.2 and 0.4)

AU - SUN, Lin

AU - CHU, Jun hao

AU - YANG, Ping xiong

AU - YUE, Fang yu

AU - LI, Ya wei

AU - FENG, Chu de

AU - MAO, Cao liang

PY - 2009/12

Y1 - 2009/12

N2 - SrBi2-χNdχNb2O9 (χ=0, 0.1, 0.2 and 0.4) bismuth layer-structured ferroelectric ceramics were prepared by the solid-state reaction sintering method. The accurate position of Nd element in SrBi2-χNdχNb2O9 ceramics was determined by the X-ray Rietveld method and Synchrotron radiation X-ray absorption fine structure (XAFS) technology. The partial substitution of Nd3+ for Bi3+ leads to the decrease in the distortion of NbO6 octahedron for SrBi2-χNdχNb2O9 ceramics and also lowers the piezoelectric properties of SrBi2-χNdχNb2O9 ceramics. Meanwhile, the temperature coefficient of resonant frequency (TCF) decreases when Nd element partially replaces Bi element in SrBi2-χNdχNb2O9 ceramics.

AB - SrBi2-χNdχNb2O9 (χ=0, 0.1, 0.2 and 0.4) bismuth layer-structured ferroelectric ceramics were prepared by the solid-state reaction sintering method. The accurate position of Nd element in SrBi2-χNdχNb2O9 ceramics was determined by the X-ray Rietveld method and Synchrotron radiation X-ray absorption fine structure (XAFS) technology. The partial substitution of Nd3+ for Bi3+ leads to the decrease in the distortion of NbO6 octahedron for SrBi2-χNdχNb2O9 ceramics and also lowers the piezoelectric properties of SrBi2-χNdχNb2O9 ceramics. Meanwhile, the temperature coefficient of resonant frequency (TCF) decreases when Nd element partially replaces Bi element in SrBi2-χNdχNb2O9 ceramics.

KW - X-ray Rietveld method

KW - bismuth layer-structured ferroelectrics

KW - piezoelectric properties

KW - synchrotron radiation XAFS

UR - https://www.scopus.com/pages/publications/72649099667

U2 - 10.1016/S1003-6326(09)60051-0

DO - 10.1016/S1003-6326(09)60051-0

M3 - 文章

AN - SCOPUS:72649099667

SN - 1003-6326

VL - 19

SP - 1459

EP - 1463

JO - Transactions of Nonferrous Metals Society of China (English Edition)

JF - Transactions of Nonferrous Metals Society of China (English Edition)

IS - 6

ER -

Influence of substitution of Nd³⁺ for Bi³⁺ on structure and piezoelectric properties of SrBi_2-χNd_χNb₂O₉ (χ=0, 0.1, 0.2 and 0.4)

Abstract

Keywords

Access to Document

Other files and links

Fingerprint

Cite this