Influence of SiO                         2                          layer thickness on plasmon enhanced upconversion in hybrid Ag/SiO                         2                         /NaYF                         4                         :Yb, Er, Gd structures

J. Shen; Z. Q. Li; Y. R. Chen; X. H. Chen; Y. W. Chen; Z. Sun; S. M. Huang

doi:10.1016/j.apsusc.2013.01.133

Influence of SiO ₂ layer thickness on plasmon enhanced upconversion in hybrid Ag/SiO ₂ /NaYF ₄ :Yb, Er, Gd structures

J. Shen
, Z. Q. Li
, Y. R. Chen
, X. H. Chen
, Y. W. Chen
, Z. Sun
, S. M. Huang^*

^*Corresponding author for this work

School of Physics and Electronic Science

East China Normal University

Research output: Contribution to journal › Article › peer-review

35 Scopus citations

Abstract

We report enhanced up-conversion (UC) photoluminescence (PL) in Ag nanoparticles/SiO ₂ /NaYF ₄ : Yb, Er, Gd film sandwiched structures. The effect of SiO ₂ layer thickness on the up-converting optical properties in the sandwiched system was investigated. The UC emission enhancement shows a pronounced distance dependence for the silica spacer layer thickness below 20 nm. The UC emission spectrum of the hybrid structured sample shows a continuous increase in intensity as the thickness of the SiO ₂ layer increases from 0 nm to 15 nm, but displays a quick decrease when the thickness of the SiO ₂ layer increases further from 15 nm. Time-resolved photoluminescence spectroscopy reveals that the fluorescence lifetimes are reduced both for green and red emissions. PL spectroscopy and excitation power studies also show that Ag nanoparticles modified the UC process in this sandwiched structure. We demonstrate switching between PL quenching and enhancement by varying the silica interface thickness. This approach allows us to perform a quantitative analysis of the effect of a metal on the UC nanorods PL intensity.

Original language	English
Pages (from-to)	712-717
Number of pages	6
Journal	Applied Surface Science
Volume	270
DOIs	https://doi.org/10.1016/j.apsusc.2013.01.133
State	Published - 1 Apr 2013

Keywords

Plasmon-enhancement
Sputtering
Upconversion nanomaterial

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10.1016/j.apsusc.2013.01.133

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Shen, J., Li, Z. Q., Chen, Y. R., Chen, X. H., Chen, Y. W., Sun, Z., & Huang, S. M. (2013). Influence of SiO ₂ layer thickness on plasmon enhanced upconversion in hybrid Ag/SiO ₂ /NaYF ₄ :Yb, Er, Gd structures Applied Surface Science, 270, 712-717. https://doi.org/10.1016/j.apsusc.2013.01.133

Shen, J. ; Li, Z. Q. ; Chen, Y. R. et al. / Influence of SiO ₂ layer thickness on plasmon enhanced upconversion in hybrid Ag/SiO ₂ /NaYF ₄ :Yb, Er, Gd structures In: Applied Surface Science. 2013 ; Vol. 270. pp. 712-717.

@article{e6a5a4851caf431aa6e0e08fb058d90a,

title = " Influence of SiO 2 layer thickness on plasmon enhanced upconversion in hybrid Ag/SiO 2 /NaYF 4 :Yb, Er, Gd structures ",

abstract = " We report enhanced up-conversion (UC) photoluminescence (PL) in Ag nanoparticles/SiO 2 /NaYF 4 : Yb, Er, Gd film sandwiched structures. The effect of SiO 2 layer thickness on the up-converting optical properties in the sandwiched system was investigated. The UC emission enhancement shows a pronounced distance dependence for the silica spacer layer thickness below 20 nm. The UC emission spectrum of the hybrid structured sample shows a continuous increase in intensity as the thickness of the SiO 2 layer increases from 0 nm to 15 nm, but displays a quick decrease when the thickness of the SiO 2 layer increases further from 15 nm. Time-resolved photoluminescence spectroscopy reveals that the fluorescence lifetimes are reduced both for green and red emissions. PL spectroscopy and excitation power studies also show that Ag nanoparticles modified the UC process in this sandwiched structure. We demonstrate switching between PL quenching and enhancement by varying the silica interface thickness. This approach allows us to perform a quantitative analysis of the effect of a metal on the UC nanorods PL intensity.",

keywords = "Plasmon-enhancement, Sputtering, Upconversion nanomaterial",

author = "J. Shen and Li, \{Z. Q.\} and Chen, \{Y. R.\} and Chen, \{X. H.\} and Chen, \{Y. W.\} and Z. Sun and Huang, \{S. M.\}",

year = "2013",

month = apr,

day = "1",

doi = "10.1016/j.apsusc.2013.01.133",

language = "英语",

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pages = "712--717",

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Shen, J, Li, ZQ, Chen, YR, Chen, XH, Chen, YW, Sun, Z & Huang, SM 2013, ' Influence of SiO ₂ layer thickness on plasmon enhanced upconversion in hybrid Ag/SiO ₂ /NaYF ₄ :Yb, Er, Gd structures ', Applied Surface Science, vol. 270, pp. 712-717. https://doi.org/10.1016/j.apsusc.2013.01.133

Influence of SiO ₂ layer thickness on plasmon enhanced upconversion in hybrid Ag/SiO ₂ /NaYF ₄ :Yb, Er, Gd structures . / Shen, J.; Li, Z. Q.; Chen, Y. R. et al.
In: Applied Surface Science, Vol. 270, 01.04.2013, p. 712-717.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - Influence of SiO 2 layer thickness on plasmon enhanced upconversion in hybrid Ag/SiO 2 /NaYF 4 :Yb, Er, Gd structures

AU - Shen, J.

AU - Li, Z. Q.

AU - Chen, Y. R.

AU - Chen, X. H.

AU - Chen, Y. W.

AU - Sun, Z.

AU - Huang, S. M.

PY - 2013/4/1

Y1 - 2013/4/1

N2 - We report enhanced up-conversion (UC) photoluminescence (PL) in Ag nanoparticles/SiO 2 /NaYF 4 : Yb, Er, Gd film sandwiched structures. The effect of SiO 2 layer thickness on the up-converting optical properties in the sandwiched system was investigated. The UC emission enhancement shows a pronounced distance dependence for the silica spacer layer thickness below 20 nm. The UC emission spectrum of the hybrid structured sample shows a continuous increase in intensity as the thickness of the SiO 2 layer increases from 0 nm to 15 nm, but displays a quick decrease when the thickness of the SiO 2 layer increases further from 15 nm. Time-resolved photoluminescence spectroscopy reveals that the fluorescence lifetimes are reduced both for green and red emissions. PL spectroscopy and excitation power studies also show that Ag nanoparticles modified the UC process in this sandwiched structure. We demonstrate switching between PL quenching and enhancement by varying the silica interface thickness. This approach allows us to perform a quantitative analysis of the effect of a metal on the UC nanorods PL intensity.

AB - We report enhanced up-conversion (UC) photoluminescence (PL) in Ag nanoparticles/SiO 2 /NaYF 4 : Yb, Er, Gd film sandwiched structures. The effect of SiO 2 layer thickness on the up-converting optical properties in the sandwiched system was investigated. The UC emission enhancement shows a pronounced distance dependence for the silica spacer layer thickness below 20 nm. The UC emission spectrum of the hybrid structured sample shows a continuous increase in intensity as the thickness of the SiO 2 layer increases from 0 nm to 15 nm, but displays a quick decrease when the thickness of the SiO 2 layer increases further from 15 nm. Time-resolved photoluminescence spectroscopy reveals that the fluorescence lifetimes are reduced both for green and red emissions. PL spectroscopy and excitation power studies also show that Ag nanoparticles modified the UC process in this sandwiched structure. We demonstrate switching between PL quenching and enhancement by varying the silica interface thickness. This approach allows us to perform a quantitative analysis of the effect of a metal on the UC nanorods PL intensity.

KW - Plasmon-enhancement

KW - Sputtering

KW - Upconversion nanomaterial

UR - https://www.scopus.com/pages/publications/84875209326

U2 - 10.1016/j.apsusc.2013.01.133

DO - 10.1016/j.apsusc.2013.01.133

M3 - 文章

AN - SCOPUS:84875209326

SN - 0169-4332

VL - 270

SP - 712

EP - 717

JO - Applied Surface Science

JF - Applied Surface Science

ER -

Shen J, Li ZQ, Chen YR, Chen XH, Chen YW, Sun Z et al. Influence of SiO ₂ layer thickness on plasmon enhanced upconversion in hybrid Ag/SiO ₂ /NaYF ₄ :Yb, Er, Gd structures Applied Surface Science. 2013 Apr 1;270:712-717. doi: 10.1016/j.apsusc.2013.01.133

Influence of SiO ₂ layer thickness on plasmon enhanced upconversion in hybrid Ag/SiO ₂ /NaYF ₄ :Yb, Er, Gd structures

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Keywords

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