Influence of Si 3 N 4 and ZnS films on transmittance of InAsSb/InAsPSb heterostructures

  • Y. Z. Gao*
  • , X. Y. Gong
  • , W. Z. Fang
  • , H. Y. Deng
  • , G. J. Hu
  • , M. Aoyama
  • , T. Yamaguchi
  • , N. Dai
  • *Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

Abstract

The transmittance of InAsSb/InAsPSb heterostructures is remarkably improved by depositing a Si 3 N 4 top layer. This demonstrates its good anti-reflective property. A study of the influence of various factors on the transmittance of the heterostructures is performed. A comparison was made between the transmittances of the heterostructures under different conditions. The different effects of Si 3 N 4 and ZnS top layers on the transmittance of the InAsSb/InAsPSb heterostructures are discussed.

Original languageEnglish
Pages (from-to)297-300
Number of pages4
JournalApplied Surface Science
Volume244
Issue number1-4
DOIs
StatePublished - 15 May 2005
Externally publishedYes
Event12th International Conference on Solid Films and Surfaces - Hammatsu, Japan
Duration: 21 Jun 200425 Jun 2004

Keywords

  • Deposition
  • FTIR
  • InAsSb/InAsPSb
  • Si N
  • Transmittance
  • ZnS

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