@inproceedings{59f0d3ab82fc4ad69419e48bf90b8e0c,
title = "Improving Defect Detection Ability of Derived Test Cases Based on Mutated UML Activity Diagrams",
abstract = "Structure coverage driven test generation is the key approach for automatic testing at source code level. However, the defect detection ability of the generated test cases should be carefully evaluated since the correlation between coverage and test effectiveness is in doubt. In this paper, we propose a test generation approach based on mutation testing with the intent to derive test cases towards finding defects rather than just covering certain syntactic structures. Moreover, instead of generating test cases from the code under test directly, we base our approach on UML activity diagrams to make it possible to decide verdicts of test inputs. Mutation operators for activity diagrams are defined and the test generation algorithms are based on solving mutated path constraints. Experimental results have shown that by applying the proposed mutated testing approach, test cases with higher defect detection ability can be generated.",
keywords = "Activity Diagram, Mutation Testing, Test Generation",
author = "Haiying Sun and Mingsong Chen and Min Zhang and Jing Liu and Ying Zhang",
note = "Publisher Copyright: {\textcopyright} 2016 IEEE.; 2016 IEEE 40th Annual Computer Software and Applications Conference, COMPSAC 2016 ; Conference date: 10-06-2016 Through 14-06-2016",
year = "2016",
month = aug,
day = "24",
doi = "10.1109/COMPSAC.2016.136",
language = "英语",
series = "Proceedings - International Computer Software and Applications Conference",
publisher = "IEEE Computer Society",
pages = "275--280",
editor = "William Claycomb and Dejan Milojicic and Ling Liu and Mihhail Matskin and Zhiyong Zhang and Sorel Reisman and Hiroyuki Sato and Zhiyong Zhang and Ahamed, \{Sheikh Iqbal\}",
booktitle = "Proceedings - 2016 IEEE 40th Annual Computer Software and Applications Conference, COMPSAC 2016",
address = "美国",
}