Abstract
Raman spectroscopy was employed to study the evolution of host lattice recrystallization in Mn+-implanted GaAs both prior to and following irradiation with Ga, As and H ions. The additional irradiation stimulates the regrowth of the host lattice after a thermal anneal of 920 °C. A competitive process between post-implantation-induced damage and recovery in the crystallization process of amorphous GaAs was observed. At a As+ fluence level exceeding 8 × 1015 cm-2, the self-implantation-enhanced recovery of the crystal dominates the regrowth stage. The vacancy supersaturation produced during additional irradiation is mainly responsible for the enhancement of recrystallization in Mn+-implanted GaAs.
| Original language | English |
|---|---|
| Pages (from-to) | 263-266 |
| Number of pages | 4 |
| Journal | Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms |
| Volume | 252 |
| Issue number | 2 |
| DOIs | |
| State | Published - Nov 2006 |
Keywords
- GaAs
- Ion implantation
- Raman spectroscopy