Abstract
Oxygen vacancies in MoOx play an essential role in interface energetics for charge injection and transport in organic devices. The influence of oxygen vacancy on energy-level alignment at the interface between MoOx and organic hole-transport layers is studied via photoemission spectroscopy. The degree of oxygen vacancies in MoOx is controlled by thermal annealing, which results in the partial reduction of Mo cations and a decrease in their work function. The hole-injection barrier at MoOx /organic interfaces increases as a consequence of the increase in oxygen deficiency.
| Original language | English |
|---|---|
| Article number | 095701 |
| Journal | Applied Physics Express |
| Volume | 6 |
| Issue number | 9 |
| DOIs | |
| State | Published - Sep 2013 |
| Externally published | Yes |