TY - JOUR
T1 - High Responsivity and Wavelength Selectivity of GaN-Based Resonant Cavity Photodiodes
AU - Li, Jing
AU - Yang, Chao
AU - Liu, Lei
AU - Cao, Haicheng
AU - Lin, Shan
AU - Xi, Xin
AU - Li, Xiaodong
AU - Ma, Zhanhong
AU - Wang, Kaiyou
AU - Patanè, Amalia
AU - Zhao, Lixia
N1 - Publisher Copyright:
© 2020 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
PY - 2020/4/1
Y1 - 2020/4/1
N2 - The implementation of blue-light photodiodes based on InGaN in emerging technologies, such as free-space visible light communication (VLC), requires transformative approaches toward enhanced performance, miniaturization, and integration beyond current Si-based technologies. This work reports on the design and realization of high-performance InGaN-based resonant cavity photodiodes with high-reflectivity lateral porous GaN distributed Bragg reflectors. The well-controlled porosification of GaN on the 2-inch wafers enables design and fabrication of optical components, unlocking the potential of nitride semiconductors for several applications. These resonant-cavity-enhanced photodiodes, which have a 12 nm-thick optically active region, exhibit a high responsivity (≈0.1 A W−1) to blue-light even without any externally applied voltage. Furthermore, the device can operate as both an emitter and a detector of visible light at well-defined wavelengths with spectral overlap between the electroluminescence emission and photocurrent responsivity, meeting the requirement of wavelength selectivity, thermal stability, and low-power consumption for VLC, with potential for integration of different functionalities, that is, light emission and detection, on a single chip without additional light filters.
AB - The implementation of blue-light photodiodes based on InGaN in emerging technologies, such as free-space visible light communication (VLC), requires transformative approaches toward enhanced performance, miniaturization, and integration beyond current Si-based technologies. This work reports on the design and realization of high-performance InGaN-based resonant cavity photodiodes with high-reflectivity lateral porous GaN distributed Bragg reflectors. The well-controlled porosification of GaN on the 2-inch wafers enables design and fabrication of optical components, unlocking the potential of nitride semiconductors for several applications. These resonant-cavity-enhanced photodiodes, which have a 12 nm-thick optically active region, exhibit a high responsivity (≈0.1 A W−1) to blue-light even without any externally applied voltage. Furthermore, the device can operate as both an emitter and a detector of visible light at well-defined wavelengths with spectral overlap between the electroluminescence emission and photocurrent responsivity, meeting the requirement of wavelength selectivity, thermal stability, and low-power consumption for VLC, with potential for integration of different functionalities, that is, light emission and detection, on a single chip without additional light filters.
KW - high responsivity
KW - high wavelength selectivity
KW - indium gallium nitride
KW - lateral porous GaN distributed Bragg reflectors
KW - resonant cavity
UR - https://www.scopus.com/pages/publications/85079718407
U2 - 10.1002/adom.201901276
DO - 10.1002/adom.201901276
M3 - 文章
AN - SCOPUS:85079718407
SN - 2195-1071
VL - 8
JO - Advanced Optical Materials
JF - Advanced Optical Materials
IS - 7
M1 - 1901276
ER -