HgCdTe/black phosphorus van der Waals heterojunction for high-performance polarization-sensitive midwave infrared photodetector

Hanxue Jiao, Xudong Wang*, Yan Chen, Shuaifei Guo, Shuaiqin Wu, Chaoyu Song, Shenyang Huang, Xinning Huang, Xiaochi Tai, Tie Lin, Hong Shen, Hugen Yan, Weida Hu, Xiangjian Meng, Junhao Chu, Yuanbo Zhang, Jianlu Wang*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

124 Scopus citations

Abstract

New-generation infrared detectors call for higher operation temperature and polarization sensitivity. For traditional HgCdTe infrared detectors, the additional polarization optics and cryogenic cooling are necessary to achieve high-performance infrared polarization detection, while they can complicate this system and limit the integration. Here, a mixed-dimensional HgCdTe/black phosphorous van der Waals heterojunction photodiode is proposed for polarization-sensitive midwave infrared photodetection. Benefiting from van der Waals integration, type III broken-gap band alignment heterojunctions are achieved. Anisotropy optical properties of black phosphorous bring polarization sensitivity from visible light to midwave infrared without external optics. Our devices show an outstanding performance at room temperature without applied bias, with peak blackbody detectivity as high as 7.93 × 1010 cm Hz1/2 W−1 and average blackbody detectivity over 2.1 × 1010 cm Hz1/2 W−1 in midwave infrared region. This strategy offers a possible practical solution for next-generation infrared detector with high operation temperature, high performance, and multi-information acquisition.

Original languageEnglish
Article numbereabn1811
JournalScience Advances
Volume8
Issue number19
DOIs
StatePublished - May 2022
Externally publishedYes

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