Guest Editorial

Kanad Basu; Mingsong Chen; Rubin Parekhji

doi:10.1007/s10836-019-05836-6

Guest Editorial

Kanad Basu
, Mingsong Chen
, Rubin Parekhji^*

^*Corresponding author for this work

Software Engineering Institute

University of Texas at Dallas
Texas Instruments

Research output: Contribution to journal › Editorial

Original language	English
Pages (from-to)	579-580
Number of pages	2
Journal	Journal of Electronic Testing: Theory and Applications (JETTA)
Volume	35
Issue number	5
DOIs	https://doi.org/10.1007/s10836-019-05836-6
State	Published - 1 Oct 2019

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title = "Guest Editorial",

author = "Kanad Basu and Mingsong Chen and Rubin Parekhji",

year = "2019",

month = oct,

day = "1",

doi = "10.1007/s10836-019-05836-6",

language = "英语",

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pages = "579--580",

journal = "Journal of Electronic Testing: Theory and Applications (JETTA)",

issn = "0923-8174",

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T1 - Guest Editorial

AU - Basu, Kanad

AU - Chen, Mingsong

AU - Parekhji, Rubin

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JO - Journal of Electronic Testing: Theory and Applications (JETTA)

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IS - 5

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Guest Editorial

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