Guest Editorial

Kanad Basu, Mingsong Chen, Rubin Parekhji^*

^*Corresponding author for this work

Research output: Contribution to journal › Editorial

Original language	English
Pages (from-to)	579-580
Number of pages	2
Journal	Journal of Electronic Testing: Theory and Applications (JETTA)
Volume	35
Issue number	5
DOIs	https://doi.org/10.1007/s10836-019-05836-6
State	Published - 1 Oct 2019

Access to Document

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title = "Guest Editorial",

author = "Kanad Basu and Mingsong Chen and Rubin Parekhji",

year = "2019",

month = oct,

day = "1",

doi = "10.1007/s10836-019-05836-6",

language = "英语",

volume = "35",

pages = "579--580",

journal = "Journal of Electronic Testing: Theory and Applications (JETTA)",

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number = "5",

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T1 - Guest Editorial

AU - Basu, Kanad

AU - Chen, Mingsong

AU - Parekhji, Rubin

PY - 2019/10/1

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UR - https://www.scopus.com/pages/publications/85075185086

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JO - Journal of Electronic Testing: Theory and Applications (JETTA)

JF - Journal of Electronic Testing: Theory and Applications (JETTA)

IS - 5

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