Growth and characterisation of CdSe:Mn quantum dots

X. Tang, B. Urbaszek, T. C.M. Graham, R. J. Warburton, K. A. Prior, B. C. Cavenett

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this paper, we report the optical properties of CdSe:Mn dots grown by Atomic Layer Epitaxy (ALE). The samples were grown on GaAs substrates with a 150nm buffer of ZnSe deposited by normal MBE. CdSe layers of different thicknesses were deposited by ALE and then capped with ZnSe. Quantum dot emission was observed for CdSe layers more than 3 ML thick. Two sets of layers containing dots have been grown which were doped with Mn to give concentrations ranging from one to approximately ten Mn ions per dot. One set was capped for optical studies and the other left uncapped. For the uncapped samples, dot densities of the order of ∼109 cm-2 were measured by Atomic Force Microscopy (AFM) measurements obtained immediately after growth (figure 1).

Original languageEnglish
Title of host publicationMBE 2002 - 2002 12th International Conference on Molecular Beam Epitaxy
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages259-260
Number of pages2
ISBN (Electronic)0780375815, 9780780375819
DOIs
StatePublished - 2002
Externally publishedYes
Event12th International Conference on Molecular Beam Epitaxy, MBE 2002 - San Francisco, United States
Duration: 15 Sep 200220 Sep 2002

Publication series

NameMBE 2002 - 2002 12th International Conference on Molecular Beam Epitaxy

Conference

Conference12th International Conference on Molecular Beam Epitaxy, MBE 2002
Country/TerritoryUnited States
CitySan Francisco
Period15/09/0220/09/02

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