Abstract
Free-carrier absorption (FCA) of Hg1-xCdxTe epitaxial films is analyzed by considering the composition-in-depth nonuniformity of epilayers. The results show that epilayers exhibit different FCA behavior from bulk materials. Based on the analyses, the carrier concentration, the density and size distribution of Te precipitates, as well as the inclusion in Hg1-xCdxTe epilayers are derived from fitting the measured FCA spectra.
| Original language | English |
|---|---|
| Pages (from-to) | 7738-7742 |
| Number of pages | 5 |
| Journal | Journal of Applied Physics |
| Volume | 79 |
| Issue number | 10 |
| DOIs | |
| State | Published - 15 May 1996 |
| Externally published | Yes |