Abstract
According to the different porous silicon fabricating process of p-type and n-type silicon substrate, a new technology of boron ion implantation to form a selective p-type array on n-type substrate is introduced. After electrochemical etching process, a selective porous silicon is obtained. By this way, the defects of the conventional mask technology are avoided. The selective porous silicon array is characterized by AFM and SEM.
| Original language | English |
|---|---|
| Pages (from-to) | 819-823 |
| Number of pages | 5 |
| Journal | Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors |
| Volume | 25 |
| Issue number | 7 |
| State | Published - Jul 2004 |
Keywords
- Boron ion implantation
- Electrochemical etching
- Selective porous silicon array