Field enhancement effect of metal probe in evanescent field

Xiaogang Hong; Wendong Xu; Xiaogang Li; Chengqiang Zhao; Xiaodong Tang

doi:10.3788/COL20090701.0074

Field enhancement effect of metal probe in evanescent field

Xiaogang Hong^*
, Wendong Xu
, Xiaogang Li
, Chengqiang Zhao
, Xiaodong Tang

^*Corresponding author for this work

School of Physics and Electronic Science

CAS - Shanghai Institute of Optics and Fine Mechanics

Research output: Contribution to journal › Article › peer-review

10 Scopus citations

Abstract

Field enhancement effect of metal probe in evanescent field, induced by using a multi-layers structure for exciting surface plasmon resonance (SPR), is analyzed numerically by utilizing two-dimensional (2D) TM-wave finite difference time-domain (FDTD) method. In this letter, we used a fundamental mode Gaussian beam to induce evanescent field, and calculated the electric intensity. The results show that compared with the nonmetal probe, the metal probe has a larger field enhancement effect, and its scattering wave induced by field enhancement has a bigger decay coefficient. The field enhancement effect should conclude that the metal probe has an important application in nanolithography.

Original language	English
Pages (from-to)	74-77
Number of pages	4
Journal	Chinese Optics Letters
Volume	7
Issue number	1
DOIs	https://doi.org/10.3788/COL20090701.0074
State	Published - Jan 2009

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title = "Field enhancement effect of metal probe in evanescent field",

abstract = "Field enhancement effect of metal probe in evanescent field, induced by using a multi-layers structure for exciting surface plasmon resonance (SPR), is analyzed numerically by utilizing two-dimensional (2D) TM-wave finite difference time-domain (FDTD) method. In this letter, we used a fundamental mode Gaussian beam to induce evanescent field, and calculated the electric intensity. The results show that compared with the nonmetal probe, the metal probe has a larger field enhancement effect, and its scattering wave induced by field enhancement has a bigger decay coefficient. The field enhancement effect should conclude that the metal probe has an important application in nanolithography.",

author = "Xiaogang Hong and Wendong Xu and Xiaogang Li and Chengqiang Zhao and Xiaodong Tang",

year = "2009",

month = jan,

doi = "10.3788/COL20090701.0074",

language = "英语",

volume = "7",

pages = "74--77",

journal = "Chinese Optics Letters",

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TY - JOUR

T1 - Field enhancement effect of metal probe in evanescent field

AU - Hong, Xiaogang

AU - Xu, Wendong

AU - Li, Xiaogang

AU - Zhao, Chengqiang

AU - Tang, Xiaodong

PY - 2009/1

Y1 - 2009/1

N2 - Field enhancement effect of metal probe in evanescent field, induced by using a multi-layers structure for exciting surface plasmon resonance (SPR), is analyzed numerically by utilizing two-dimensional (2D) TM-wave finite difference time-domain (FDTD) method. In this letter, we used a fundamental mode Gaussian beam to induce evanescent field, and calculated the electric intensity. The results show that compared with the nonmetal probe, the metal probe has a larger field enhancement effect, and its scattering wave induced by field enhancement has a bigger decay coefficient. The field enhancement effect should conclude that the metal probe has an important application in nanolithography.

AB - Field enhancement effect of metal probe in evanescent field, induced by using a multi-layers structure for exciting surface plasmon resonance (SPR), is analyzed numerically by utilizing two-dimensional (2D) TM-wave finite difference time-domain (FDTD) method. In this letter, we used a fundamental mode Gaussian beam to induce evanescent field, and calculated the electric intensity. The results show that compared with the nonmetal probe, the metal probe has a larger field enhancement effect, and its scattering wave induced by field enhancement has a bigger decay coefficient. The field enhancement effect should conclude that the metal probe has an important application in nanolithography.

UR - https://www.scopus.com/pages/publications/60149091534

U2 - 10.3788/COL20090701.0074

DO - 10.3788/COL20090701.0074

M3 - 文章

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SN - 1671-7694

VL - 7

SP - 74

EP - 77

JO - Chinese Optics Letters

JF - Chinese Optics Letters

IS - 1

ER -

Field enhancement effect of metal probe in evanescent field

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