Ferroelectric properties of PbZr0.40Ti0.60O 3/LaxSr1-xCoO3 heterostructures prepared by chemical solution routes

G. S. Wang; X. J. Meng; J. L. Sun; J. H. Chu; D. Rèmiens

doi:10.1080/10584580490894744

Ferroelectric properties of PbZr_0.40Ti_0.60O ₃/La_xSr_1-xCoO₃ heterostructures prepared by chemical solution routes

G. S. Wang, X. J. Meng, J. L. Sun, J. H. Chu, D. Rèmiens

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

PbZr_0.40Ti_0.60O₃/La_xSr _1-xCoO₃ (PZT/LSCO) heterostructures have been grown on Si-based substrates by chemical solution routes. X-ray diffraction analysis showed that PZT on LSCO are polycrystalline with (110) orientation and entirely perovskite phase. The resistance of LSCO is strongly affected by the ratio of La/Sr and the annealing atmosphere for the LSCO thin films. The ferroelectricity of PZT is strongly dependent on LSCO electrode, the P-E hystersis loops of PZT deposited on LSCO which annealed in air is more asymmetry than that annealed in oxygen. At the applied electric field of 300 kV/cm, all PZT films have the resisitivity larger than 10¹⁰ Ω cm. The fatigue resistance is strongly affected by the resistance of the LSCO electrode. The ferroelctric properties are strongly improved by LSCO buffer layer between PZT and Pt bottom electrode.

Original language	English
Pages (from-to)	277-288
Number of pages	12
Journal	Integrated Ferroelectrics
Volume	64
DOIs	https://doi.org/10.1080/10584580490894744
State	Published - 2004
Externally published	Yes

Keywords

Chemical solution routes
Ferroelectricity
LSCO films
PZT thin films

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title = "Ferroelectric properties of PbZr0.40Ti0.60O 3/LaxSr1-xCoO3 heterostructures prepared by chemical solution routes",

abstract = "PbZr0.40Ti0.60O3/LaxSr 1-xCoO3 (PZT/LSCO) heterostructures have been grown on Si-based substrates by chemical solution routes. X-ray diffraction analysis showed that PZT on LSCO are polycrystalline with (110) orientation and entirely perovskite phase. The resistance of LSCO is strongly affected by the ratio of La/Sr and the annealing atmosphere for the LSCO thin films. The ferroelectricity of PZT is strongly dependent on LSCO electrode, the P-E hystersis loops of PZT deposited on LSCO which annealed in air is more asymmetry than that annealed in oxygen. At the applied electric field of 300 kV/cm, all PZT films have the resisitivity larger than 1010 Ω cm. The fatigue resistance is strongly affected by the resistance of the LSCO electrode. The ferroelctric properties are strongly improved by LSCO buffer layer between PZT and Pt bottom electrode.",

keywords = "Chemical solution routes, Ferroelectricity, LSCO films, PZT thin films",

author = "Wang, \{G. S.\} and Meng, \{X. J.\} and Sun, \{J. L.\} and Chu, \{J. H.\} and D. R{\`e}miens",

year = "2004",

doi = "10.1080/10584580490894744",

language = "英语",

volume = "64",

pages = "277--288",

journal = "Integrated Ferroelectrics",

issn = "1058-4587",

publisher = "Taylor and Francis Ltd.",

}

TY - JOUR

T1 - Ferroelectric properties of PbZr0.40Ti0.60O 3/LaxSr1-xCoO3 heterostructures prepared by chemical solution routes

AU - Wang, G. S.

AU - Meng, X. J.

AU - Sun, J. L.

AU - Chu, J. H.

AU - Rèmiens, D.

PY - 2004

Y1 - 2004

N2 - PbZr0.40Ti0.60O3/LaxSr 1-xCoO3 (PZT/LSCO) heterostructures have been grown on Si-based substrates by chemical solution routes. X-ray diffraction analysis showed that PZT on LSCO are polycrystalline with (110) orientation and entirely perovskite phase. The resistance of LSCO is strongly affected by the ratio of La/Sr and the annealing atmosphere for the LSCO thin films. The ferroelectricity of PZT is strongly dependent on LSCO electrode, the P-E hystersis loops of PZT deposited on LSCO which annealed in air is more asymmetry than that annealed in oxygen. At the applied electric field of 300 kV/cm, all PZT films have the resisitivity larger than 1010 Ω cm. The fatigue resistance is strongly affected by the resistance of the LSCO electrode. The ferroelctric properties are strongly improved by LSCO buffer layer between PZT and Pt bottom electrode.

AB - PbZr0.40Ti0.60O3/LaxSr 1-xCoO3 (PZT/LSCO) heterostructures have been grown on Si-based substrates by chemical solution routes. X-ray diffraction analysis showed that PZT on LSCO are polycrystalline with (110) orientation and entirely perovskite phase. The resistance of LSCO is strongly affected by the ratio of La/Sr and the annealing atmosphere for the LSCO thin films. The ferroelectricity of PZT is strongly dependent on LSCO electrode, the P-E hystersis loops of PZT deposited on LSCO which annealed in air is more asymmetry than that annealed in oxygen. At the applied electric field of 300 kV/cm, all PZT films have the resisitivity larger than 1010 Ω cm. The fatigue resistance is strongly affected by the resistance of the LSCO electrode. The ferroelctric properties are strongly improved by LSCO buffer layer between PZT and Pt bottom electrode.

KW - Chemical solution routes

KW - Ferroelectricity

KW - LSCO films

KW - PZT thin films

UR - https://www.scopus.com/pages/publications/33749603337

U2 - 10.1080/10584580490894744

DO - 10.1080/10584580490894744

M3 - 文章

AN - SCOPUS:33749603337

SN - 1058-4587

VL - 64

SP - 277

EP - 288

JO - Integrated Ferroelectrics

JF - Integrated Ferroelectrics

ER -

Ferroelectric properties of PbZr_0.40Ti_0.60O ₃/La_xSr_1-xCoO₃ heterostructures prepared by chemical solution routes

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Keywords

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