Ferroelectric and optical properties of quasiperiodic PbZr 0.5Ti0.5O3 multilayers grown on quartz wafers

G. J. Hu; X. K. Hong; J. H. Chu; N. Dai

doi:10.1063/1.2722567

Ferroelectric and optical properties of quasiperiodic PbZr _0.5Ti_0.5O₃ multilayers grown on quartz wafers

G. J. Hu^*
, X. K. Hong
, J. H. Chu
, N. Dai

^*Corresponding author for this work

CAS - Shanghai Institute of Technical Physics

Research output: Contribution to journal › Article › peer-review

13 Scopus citations

Abstract

PbZr_0.5Ti_0.5O₃ (PZT) multilayers with total thickness of a few microns have been grown on quartz substrates by using sol gel technique. The PZT multilayer displays a well-defined polarization hysteresis loop with a nominally average remanent polarization of 36.5 μC/cm2 and an average coercive field of 66.5 kV/cm under a maximum applied voltage of 100 V. With 17 periods, 95% reflectivity and 62 nm stop-band width have been achieved at room temperature, indicating that the quasiperiodic PZT multilayer can be used as dielectric reflectors and filters.

Original language	English
Article number	162904
Journal	Applied Physics Letters
Volume	90
Issue number	16
DOIs	https://doi.org/10.1063/1.2722567
State	Published - 2007
Externally published	Yes

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title = "Ferroelectric and optical properties of quasiperiodic PbZr 0.5Ti0.5O3 multilayers grown on quartz wafers",

abstract = "PbZr0.5Ti0.5O3 (PZT) multilayers with total thickness of a few microns have been grown on quartz substrates by using sol gel technique. The PZT multilayer displays a well-defined polarization hysteresis loop with a nominally average remanent polarization of 36.5 μC/cm2 and an average coercive field of 66.5 kV/cm under a maximum applied voltage of 100 V. With 17 periods, 95\% reflectivity and 62 nm stop-band width have been achieved at room temperature, indicating that the quasiperiodic PZT multilayer can be used as dielectric reflectors and filters.",

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T1 - Ferroelectric and optical properties of quasiperiodic PbZr 0.5Ti0.5O3 multilayers grown on quartz wafers

AU - Hu, G. J.

AU - Hong, X. K.

AU - Chu, J. H.

AU - Dai, N.

PY - 2007

Y1 - 2007

N2 - PbZr0.5Ti0.5O3 (PZT) multilayers with total thickness of a few microns have been grown on quartz substrates by using sol gel technique. The PZT multilayer displays a well-defined polarization hysteresis loop with a nominally average remanent polarization of 36.5 μC/cm2 and an average coercive field of 66.5 kV/cm under a maximum applied voltage of 100 V. With 17 periods, 95% reflectivity and 62 nm stop-band width have been achieved at room temperature, indicating that the quasiperiodic PZT multilayer can be used as dielectric reflectors and filters.

AB - PbZr0.5Ti0.5O3 (PZT) multilayers with total thickness of a few microns have been grown on quartz substrates by using sol gel technique. The PZT multilayer displays a well-defined polarization hysteresis loop with a nominally average remanent polarization of 36.5 μC/cm2 and an average coercive field of 66.5 kV/cm under a maximum applied voltage of 100 V. With 17 periods, 95% reflectivity and 62 nm stop-band width have been achieved at room temperature, indicating that the quasiperiodic PZT multilayer can be used as dielectric reflectors and filters.

UR - https://www.scopus.com/pages/publications/34247365491

U2 - 10.1063/1.2722567

DO - 10.1063/1.2722567

M3 - 文章

AN - SCOPUS:34247365491

SN - 0003-6951

VL - 90

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 16

M1 - 162904

ER -

Ferroelectric and optical properties of quasiperiodic PbZr _0.5Ti_0.5O₃ multilayers grown on quartz wafers

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