Abstract
The uniform, dense, and crack-free PbZr0.4Ti0.6O3/ PbZr0.5Ti0.5O3 bilayer with (100)-preferred crystal orientation and a single perovskite phase was fabricated on LaNiO3-coated Si substrate by using chemical solution deposition. The bilayer exhibits excellent ferroelectric properties, remnant polarization of 64 μC/cm2 and coercive field of 43.6 kV/cm. The prism-film coupling measurement indicates that four transverse electric modes can be excited in the system of Si/LaNiO3/PbZr0.5 Ti0.5O3/PbZr0.4Ti0.6 O3 and the light can be effectively confined to propagate in the guiding-layer. The refractive index and thickness for each film were obtained by solving the mode eigen-equation of the waveguide.
| Original language | English |
|---|---|
| Pages (from-to) | 5968-5972 |
| Number of pages | 5 |
| Journal | Wuli Xuebao/Acta Physica Sinica |
| Volume | 57 |
| Issue number | 9 |
| State | Published - Sep 2008 |
| Externally published | Yes |
Keywords
- Ferroelectric film
- Lead zirconate titanate
- Planar optical waveguide
- The prism-film coupling