Ferroelectric and optical properties of Pb(ZrxTi1-x)O3 bilayers

Xiao Ying Zhao, Shi Jian Liu, Jun Hao Chu, Ning Dai, Gu Jin Hu

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Abstract

The uniform, dense, and crack-free PbZr0.4Ti0.6O3/ PbZr0.5Ti0.5O3 bilayer with (100)-preferred crystal orientation and a single perovskite phase was fabricated on LaNiO3-coated Si substrate by using chemical solution deposition. The bilayer exhibits excellent ferroelectric properties, remnant polarization of 64 μC/cm2 and coercive field of 43.6 kV/cm. The prism-film coupling measurement indicates that four transverse electric modes can be excited in the system of Si/LaNiO3/PbZr0.5 Ti0.5O3/PbZr0.4Ti0.6 O3 and the light can be effectively confined to propagate in the guiding-layer. The refractive index and thickness for each film were obtained by solving the mode eigen-equation of the waveguide.

Original languageEnglish
Pages (from-to)5968-5972
Number of pages5
JournalWuli Xuebao/Acta Physica Sinica
Volume57
Issue number9
StatePublished - Sep 2008
Externally publishedYes

Keywords

  • Ferroelectric film
  • Lead zirconate titanate
  • Planar optical waveguide
  • The prism-film coupling

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