Ferroelectric and optical properties of Bi3.25Nd 0.75Ti3O12 thin films prepared by a chemical solution method

Jianhua Ma; Xiangjian Meng; Jinlan Sun; Tie Lin; Fuwen Shi; Junhao Chu

doi:10.1088/0022-3727/37/22/017

Ferroelectric and optical properties of Bi_3.25Nd _0.75Ti₃O₁₂ thin films prepared by a chemical solution method

Jianhua Ma, Xiangjian Meng, Jinlan Sun, Tie Lin, Fuwen Shi, Junhao Chu

CAS - Shanghai Institute of Technical Physics

Research output: Contribution to journal › Article › peer-review

11 Scopus citations

Abstract

The ferroelectric and optical properties of Bi_3.25Nd _0.75Ti₃O₁₂ thin films deposited on (111)Pt/Ti/SiO₂/Si substrates using a chemical solution method were investigated. Bi_3.25Nd_0.75Ti₃O₁₂ thin films were polycrystalline and had (117) random orientation with large rod-like grains. They showed good ferroelectricity with a remnant polarization of 13.8 μC cm^-2 and a coercive field of 120 kV cm^-1. The dielectric constant and the dissipation factor were about 200 and 0.040, respectively, at a frequency of 10 kHz. No polarization fatigue was observed for the Pt/Bi_3.25Nd_0.75Ti₃O₁₂/Pt capacitor after 10⁹ switching cycles. The optical constants (refractive index and extinction coefficient) in the wavelength range of 200-1700 nm were obtained by spectroscopic ellipsometry measurements. The optical band gap was estimated to be about 3.61 eV. The dispersion of the refractive index in the interband transition region followed the single electronic oscillator model.

Original language	English
Pages (from-to)	3160-3164
Number of pages	5
Journal	Journal of Physics D: Applied Physics
Volume	37
Issue number	22
DOIs	https://doi.org/10.1088/0022-3727/37/22/017
State	Published - 21 Nov 2004
Externally published	Yes

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title = "Ferroelectric and optical properties of Bi3.25Nd 0.75Ti3O12 thin films prepared by a chemical solution method",

abstract = "The ferroelectric and optical properties of Bi3.25Nd 0.75Ti3O12 thin films deposited on (111)Pt/Ti/SiO2/Si substrates using a chemical solution method were investigated. Bi3.25Nd0.75Ti3O12 thin films were polycrystalline and had (117) random orientation with large rod-like grains. They showed good ferroelectricity with a remnant polarization of 13.8 μC cm-2 and a coercive field of 120 kV cm-1. The dielectric constant and the dissipation factor were about 200 and 0.040, respectively, at a frequency of 10 kHz. No polarization fatigue was observed for the Pt/Bi3.25Nd0.75Ti3O12/Pt capacitor after 109 switching cycles. The optical constants (refractive index and extinction coefficient) in the wavelength range of 200-1700 nm were obtained by spectroscopic ellipsometry measurements. The optical band gap was estimated to be about 3.61 eV. The dispersion of the refractive index in the interband transition region followed the single electronic oscillator model.",

author = "Jianhua Ma and Xiangjian Meng and Jinlan Sun and Tie Lin and Fuwen Shi and Junhao Chu",

year = "2004",

month = nov,

day = "21",

doi = "10.1088/0022-3727/37/22/017",

language = "英语",

volume = "37",

pages = "3160--3164",

journal = "Journal of Physics D: Applied Physics",

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TY - JOUR

T1 - Ferroelectric and optical properties of Bi3.25Nd 0.75Ti3O12 thin films prepared by a chemical solution method

AU - Ma, Jianhua

AU - Meng, Xiangjian

AU - Sun, Jinlan

AU - Lin, Tie

AU - Shi, Fuwen

AU - Chu, Junhao

PY - 2004/11/21

Y1 - 2004/11/21

N2 - The ferroelectric and optical properties of Bi3.25Nd 0.75Ti3O12 thin films deposited on (111)Pt/Ti/SiO2/Si substrates using a chemical solution method were investigated. Bi3.25Nd0.75Ti3O12 thin films were polycrystalline and had (117) random orientation with large rod-like grains. They showed good ferroelectricity with a remnant polarization of 13.8 μC cm-2 and a coercive field of 120 kV cm-1. The dielectric constant and the dissipation factor were about 200 and 0.040, respectively, at a frequency of 10 kHz. No polarization fatigue was observed for the Pt/Bi3.25Nd0.75Ti3O12/Pt capacitor after 109 switching cycles. The optical constants (refractive index and extinction coefficient) in the wavelength range of 200-1700 nm were obtained by spectroscopic ellipsometry measurements. The optical band gap was estimated to be about 3.61 eV. The dispersion of the refractive index in the interband transition region followed the single electronic oscillator model.

AB - The ferroelectric and optical properties of Bi3.25Nd 0.75Ti3O12 thin films deposited on (111)Pt/Ti/SiO2/Si substrates using a chemical solution method were investigated. Bi3.25Nd0.75Ti3O12 thin films were polycrystalline and had (117) random orientation with large rod-like grains. They showed good ferroelectricity with a remnant polarization of 13.8 μC cm-2 and a coercive field of 120 kV cm-1. The dielectric constant and the dissipation factor were about 200 and 0.040, respectively, at a frequency of 10 kHz. No polarization fatigue was observed for the Pt/Bi3.25Nd0.75Ti3O12/Pt capacitor after 109 switching cycles. The optical constants (refractive index and extinction coefficient) in the wavelength range of 200-1700 nm were obtained by spectroscopic ellipsometry measurements. The optical band gap was estimated to be about 3.61 eV. The dispersion of the refractive index in the interband transition region followed the single electronic oscillator model.

UR - https://www.scopus.com/pages/publications/9944244575

U2 - 10.1088/0022-3727/37/22/017

DO - 10.1088/0022-3727/37/22/017

M3 - 文章

AN - SCOPUS:9944244575

SN - 0022-3727

VL - 37

SP - 3160

EP - 3164

JO - Journal of Physics D: Applied Physics

JF - Journal of Physics D: Applied Physics

IS - 22

ER -

Ferroelectric and optical properties of Bi_3.25Nd _0.75Ti₃O₁₂ thin films prepared by a chemical solution method

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