Abstract
High-quality Sb 2Te 3 films are obtained by molecular beam epitaxy on a graphene substrate and investigated by in situ scanning tunneling microscopy and spectroscopy. Intrinsic defects responsible for the natural p-type conductivity of Sb 2Te 3 are identified to be the Sb vacancies and Sb Te antisites in agreement with first-principles calculations. By minimizing defect densities, coupled with a transfer doping by the graphene substrate, the Fermi level of Sb 2Te 3 thin films can be tuned over the entire range of the bulk band gap. This establishes the necessary condition to explore topological insulator behaviors near the Dirac point.
| Original language | English |
|---|---|
| Article number | 066809 |
| Journal | Physical Review Letters |
| Volume | 108 |
| Issue number | 6 |
| DOIs | |
| State | Published - 10 Feb 2012 |
| Externally published | Yes |