Feedback-Guided Circuit Structure Mutation for Testing Hardware Model Checkers

Chengyu Zhang; Minquan Sun; Jianwen Li; Ting Su; Geguang Pu

doi:10.1109/ICCAD51958.2021.9643509

Feedback-Guided Circuit Structure Mutation for Testing Hardware Model Checkers

Chengyu Zhang, Minquan Sun, Jianwen Li, Ting Su, Geguang Pu^*

^*Corresponding author for this work

Software Engineering Institute

East China Normal University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

We introduce Circuit Structure Mutation, a simple but effective mutation-based testing approach, for testing hardware model checkers. The key idea is to mutate the existing And-Inverter Graph (AIG) circuit by manipulating the relations among the components in the graph while preserving the validity of the mutant. Based on Circuit Structure Mutation, we implemented a feedback-guided testing tool named Hammer. In our evaluation, Hammer shows its effectiveness on finding bugs, increasing test coverage, and finding performance optimization chances, which can help the hardware model checker developers improve the reliability and the performance of their tools.

Original language	English
Title of host publication	2021 40th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2021 - Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781665445078
DOIs	https://doi.org/10.1109/ICCAD51958.2021.9643509
State	Published - 2021
Event	40th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2021 - Munich, Germany Duration: 1 Nov 2021 → 4 Nov 2021

Publication series

Name	IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
Volume	2021-November
ISSN (Print)	1092-3152

Conference

Conference	40th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2021
Country/Territory	Germany
City	Munich
Period	1/11/21 → 4/11/21

Keywords

Hardware Model Checking
Software Testing
Test Case Generation

Access to Document

10.1109/ICCAD51958.2021.9643509

Cite this

Zhang, C., Sun, M., Li, J., Su, T., & Pu, G. (2021). Feedback-Guided Circuit Structure Mutation for Testing Hardware Model Checkers. In 2021 40th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2021 - Proceedings (IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD; Vol. 2021-November). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICCAD51958.2021.9643509

Zhang, Chengyu ; Sun, Minquan ; Li, Jianwen et al. / Feedback-Guided Circuit Structure Mutation for Testing Hardware Model Checkers. 2021 40th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2021 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2021. (IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD).

@inproceedings{c60f21d238f94b4ab7bbb53670e1c9a9,

title = "Feedback-Guided Circuit Structure Mutation for Testing Hardware Model Checkers",

abstract = "We introduce Circuit Structure Mutation, a simple but effective mutation-based testing approach, for testing hardware model checkers. The key idea is to mutate the existing And-Inverter Graph (AIG) circuit by manipulating the relations among the components in the graph while preserving the validity of the mutant. Based on Circuit Structure Mutation, we implemented a feedback-guided testing tool named Hammer. In our evaluation, Hammer shows its effectiveness on finding bugs, increasing test coverage, and finding performance optimization chances, which can help the hardware model checker developers improve the reliability and the performance of their tools.",

keywords = "Hardware Model Checking, Software Testing, Test Case Generation",

author = "Chengyu Zhang and Minquan Sun and Jianwen Li and Ting Su and Geguang Pu",

note = "Publisher Copyright: {\textcopyright} 2021 Institute of Electrical and Electronics Engineers Inc.. All rights reserved.; 40th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2021 ; Conference date: 01-11-2021 Through 04-11-2021",

year = "2021",

doi = "10.1109/ICCAD51958.2021.9643509",

language = "英语",

series = "IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "2021 40th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2021 - Proceedings",

address = "美国",

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Zhang, C, Sun, M, Li, J , Su, T & Pu, G 2021, Feedback-Guided Circuit Structure Mutation for Testing Hardware Model Checkers. in 2021 40th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2021 - Proceedings. IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD, vol. 2021-November, Institute of Electrical and Electronics Engineers Inc., 40th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2021, Munich, Germany, 1/11/21. https://doi.org/10.1109/ICCAD51958.2021.9643509

Feedback-Guided Circuit Structure Mutation for Testing Hardware Model Checkers. / Zhang, Chengyu; Sun, Minquan; Li, Jianwen et al.
2021 40th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2021 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2021. (IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD; Vol. 2021-November).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Feedback-Guided Circuit Structure Mutation for Testing Hardware Model Checkers

AU - Zhang, Chengyu

AU - Sun, Minquan

AU - Li, Jianwen

AU - Su, Ting

AU - Pu, Geguang

PY - 2021

Y1 - 2021

N2 - We introduce Circuit Structure Mutation, a simple but effective mutation-based testing approach, for testing hardware model checkers. The key idea is to mutate the existing And-Inverter Graph (AIG) circuit by manipulating the relations among the components in the graph while preserving the validity of the mutant. Based on Circuit Structure Mutation, we implemented a feedback-guided testing tool named Hammer. In our evaluation, Hammer shows its effectiveness on finding bugs, increasing test coverage, and finding performance optimization chances, which can help the hardware model checker developers improve the reliability and the performance of their tools.

AB - We introduce Circuit Structure Mutation, a simple but effective mutation-based testing approach, for testing hardware model checkers. The key idea is to mutate the existing And-Inverter Graph (AIG) circuit by manipulating the relations among the components in the graph while preserving the validity of the mutant. Based on Circuit Structure Mutation, we implemented a feedback-guided testing tool named Hammer. In our evaluation, Hammer shows its effectiveness on finding bugs, increasing test coverage, and finding performance optimization chances, which can help the hardware model checker developers improve the reliability and the performance of their tools.

KW - Hardware Model Checking

KW - Software Testing

KW - Test Case Generation

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U2 - 10.1109/ICCAD51958.2021.9643509

DO - 10.1109/ICCAD51958.2021.9643509

M3 - 会议稿件

AN - SCOPUS:85124135287

T3 - IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD

BT - 2021 40th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2021 - Proceedings

PB - Institute of Electrical and Electronics Engineers Inc.

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Y2 - 1 November 2021 through 4 November 2021

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Zhang C, Sun M, Li J , Su T , Pu G. Feedback-Guided Circuit Structure Mutation for Testing Hardware Model Checkers. In 2021 40th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2021 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2021. (IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD). doi: 10.1109/ICCAD51958.2021.9643509

Feedback-Guided Circuit Structure Mutation for Testing Hardware Model Checkers

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