Fatigue properties of LaNiO3/PbZr0.4 Ti0.6O3/LaNiO3 heterostructures

Gen Shui Wang; Qiang Zhao; Xiang Jian Meng; Fu Wen Shi; Jing Lan Sun; Jun Hao Chu

Fatigue properties of LaNiO₃/PbZr_0.4 Ti_0.6O₃/LaNiO₃ heterostructures

Gen Shui Wang^*
, Qiang Zhao
, Xiang Jian Meng
, Fu Wen Shi
, Jing Lan Sun
, Jun Hao Chu

^*Corresponding author for this work

CAS - Shanghai Institute of Technical Physics

Research output: Contribution to journal › Article › peer-review

Abstract

PbZr_0.4Ti_0.6O₃/LaNiO₃ heterostructures have been grown on Si-based substrates by chemical solution routes. The microstructure and morphology of the prepared PbZr_0.4Ti_0.6O₃ and LaNiO₃ thin films were investigated via X-ray diffractometry and atomic force microscopy techniques. PbZr_0.4Ti_0.6O₃ and LaNiO₃ show highly (100) orientation. The PbZr_0.4Ti_0.6O₃ thin films show smooth surface morphology, denser structure. At an applied electric field of 400 kV/cm, The remnant polarization (P_r) and coercive field (E_c) of the PbZr_0.4Ti_0.6O₃ thin films were obtained from the P-V loop measurements about 14.6 μC/cm² and 41 kV/cm, respectively. LaNiO₃/PbZr_0.4Ti_0.6O₃/ LaNiO₃ show little polarization degradation after 108 fatigue cycles. The effect of Pb content in precursor solution on microstructure and polarization properties of LaNiO₃/PbZr_0.4 Ti_0.6O₃/LaNiO₃ were investigated.

Original language	English
Pages (from-to)	72-75
Number of pages	4
Journal	Yadian Yu Shengguang/Piezoelectrics and Acoustooptics
Volume	28
Issue number	1
State	Published - Feb 2006
Externally published	Yes

Keywords

Fatigue properties
Heterostructures
LaNiO thin films
PbZrTiO ferroelectric thin films

Cite this

@article{757a8c1e34604a3b80da507229429446,

title = "Fatigue properties of LaNiO3/PbZr0.4 Ti0.6O3/LaNiO3 heterostructures",

abstract = "PbZr0.4Ti0.6O3/LaNiO3 heterostructures have been grown on Si-based substrates by chemical solution routes. The microstructure and morphology of the prepared PbZr0.4Ti0.6O3 and LaNiO3 thin films were investigated via X-ray diffractometry and atomic force microscopy techniques. PbZr0.4Ti0.6O3 and LaNiO3 show highly (100) orientation. The PbZr0.4Ti0.6O3 thin films show smooth surface morphology, denser structure. At an applied electric field of 400 kV/cm, The remnant polarization (Pr) and coercive field (Ec) of the PbZr0.4Ti0.6O3 thin films were obtained from the P-V loop measurements about 14.6 μC/cm2 and 41 kV/cm, respectively. LaNiO3/PbZr0.4Ti0.6O3/ LaNiO3 show little polarization degradation after 108 fatigue cycles. The effect of Pb content in precursor solution on microstructure and polarization properties of LaNiO3/PbZr0.4 Ti0.6O3/LaNiO3 were investigated.",

keywords = "Fatigue properties, Heterostructures, LaNiO thin films, PbZrTiO ferroelectric thin films",

author = "Wang, \{Gen Shui\} and Qiang Zhao and Meng, \{Xiang Jian\} and Shi, \{Fu Wen\} and Sun, \{Jing Lan\} and Chu, \{Jun Hao\}",

year = "2006",

month = feb,

language = "英语",

volume = "28",

pages = "72--75",

journal = "Yadian Yu Shengguang/Piezoelectrics and Acoustooptics",

issn = "1004-2474",

publisher = "Sichuan Institute of Piezoelectric and Acoustooptic Technology",

number = "1",

}

TY - JOUR

T1 - Fatigue properties of LaNiO3/PbZr0.4 Ti0.6O3/LaNiO3 heterostructures

AU - Wang, Gen Shui

AU - Zhao, Qiang

AU - Meng, Xiang Jian

AU - Shi, Fu Wen

AU - Sun, Jing Lan

AU - Chu, Jun Hao

PY - 2006/2

Y1 - 2006/2

N2 - PbZr0.4Ti0.6O3/LaNiO3 heterostructures have been grown on Si-based substrates by chemical solution routes. The microstructure and morphology of the prepared PbZr0.4Ti0.6O3 and LaNiO3 thin films were investigated via X-ray diffractometry and atomic force microscopy techniques. PbZr0.4Ti0.6O3 and LaNiO3 show highly (100) orientation. The PbZr0.4Ti0.6O3 thin films show smooth surface morphology, denser structure. At an applied electric field of 400 kV/cm, The remnant polarization (Pr) and coercive field (Ec) of the PbZr0.4Ti0.6O3 thin films were obtained from the P-V loop measurements about 14.6 μC/cm2 and 41 kV/cm, respectively. LaNiO3/PbZr0.4Ti0.6O3/ LaNiO3 show little polarization degradation after 108 fatigue cycles. The effect of Pb content in precursor solution on microstructure and polarization properties of LaNiO3/PbZr0.4 Ti0.6O3/LaNiO3 were investigated.

AB - PbZr0.4Ti0.6O3/LaNiO3 heterostructures have been grown on Si-based substrates by chemical solution routes. The microstructure and morphology of the prepared PbZr0.4Ti0.6O3 and LaNiO3 thin films were investigated via X-ray diffractometry and atomic force microscopy techniques. PbZr0.4Ti0.6O3 and LaNiO3 show highly (100) orientation. The PbZr0.4Ti0.6O3 thin films show smooth surface morphology, denser structure. At an applied electric field of 400 kV/cm, The remnant polarization (Pr) and coercive field (Ec) of the PbZr0.4Ti0.6O3 thin films were obtained from the P-V loop measurements about 14.6 μC/cm2 and 41 kV/cm, respectively. LaNiO3/PbZr0.4Ti0.6O3/ LaNiO3 show little polarization degradation after 108 fatigue cycles. The effect of Pb content in precursor solution on microstructure and polarization properties of LaNiO3/PbZr0.4 Ti0.6O3/LaNiO3 were investigated.

KW - Fatigue properties

KW - Heterostructures

KW - LaNiO thin films

KW - PbZrTiO ferroelectric thin films

UR - https://www.scopus.com/pages/publications/33644950298

M3 - 文章

AN - SCOPUS:33644950298

SN - 1004-2474

VL - 28

SP - 72

EP - 75

JO - Yadian Yu Shengguang/Piezoelectrics and Acoustooptics

JF - Yadian Yu Shengguang/Piezoelectrics and Acoustooptics

IS - 1

ER -

Fatigue properties of LaNiO₃/PbZr_0.4 Ti_0.6O₃/LaNiO₃ heterostructures

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Keywords

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