Abstract
Extreme sensitivity of room-temperature photoelectric effect for terahertz (THz) detection is demonstrated by generating extra carriers in an electromagnetic induced well located at the semiconductor, using a wrapped metal-semiconductor-metal configuration. The excellent performance achieved with THz detectors shows great potential to open avenues for THz detection.
| Original language | English |
|---|---|
| Pages (from-to) | 112-117 |
| Number of pages | 6 |
| Journal | Advanced Materials |
| Volume | 28 |
| Issue number | 1 |
| DOIs | |
| State | Published - 6 Jan 2016 |
| Externally published | Yes |
Keywords
- electromagnetic induced wells
- photoelectric effect
- terahertz detection