Extracting software functional requirements from free text documents

Yunhe Mu*, Yinglin Wang, Jianmei Guo

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

31 Scopus citations

Abstract

The acquisition of requirements assets are important in software product line (SPL) engineering for it help enhancing the effectiveness of reuse. Traditional methods are heavily based on manual effort. This appears to be a barrier for many organizations which tend to launch a SPL. In this paper, we propose an approach to extract functional requirements by analyzing text-based software requirements specifications (SRSs). We analyze the linguistic characterizat-ion of SRSs. According to it we define extended functional requirements framework (EFRF) which consists of 10 semantic cases, then we generate converting rules. We introduce an NLP (Natural Language Process) approach to build EFRFs from documents based on the concept of EFRF and the converting rules. The extracted EFRFs are suitable for expression and modeling of functional requirements variability. We apply our method to an auto-marker software product line. The result shows the approach has high accuracy and efficiency, and the approach is readily scalable and extensible.

Original languageEnglish
Title of host publication2009 International Conference on Information and Multimedia Technology, ICIMT 2009
Pages194-198
Number of pages5
DOIs
StatePublished - 2009
Externally publishedYes
Event2009 International Conference on Information and Multimedia Technology, ICIMT 2009 - Jeju Island, Korea, Republic of
Duration: 16 Dec 200918 Dec 2009

Publication series

Name2009 International Conference on Information and Multimedia Technology, ICIMT 2009

Conference

Conference2009 International Conference on Information and Multimedia Technology, ICIMT 2009
Country/TerritoryKorea, Republic of
CityJeju Island
Period16/12/0918/12/09

Keywords

  • Functional requirement
  • Information extract
  • Product line
  • Rule-based
  • Variability model

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