Abstract
Interface structure and crystallization behavior play an important role in the reflectivity of multilayer mirrors. In this study, Mo/B4C multilayers were prepared by magnetron sputtering technology with the introduction of CH4 gases to investigate crystallization behavior, interface diffusion, as well as interface roughness. The results indicate that the introduction of CH4 gases reduced the crystallinity of the Mo layers to some extent and altered the phase composition. All samples possessed a well-defined periodic structure. The Mo layer was primarily in a microcrystalline or amorphous state, thereby effectively reducing the interface roughness of the multilayer film. Additionally, with the introduction of CH4 gases, an interlayer of molybdenum carbide was formed at the B4C-on-Mo interface, effectively preventing interface diffusion between the layers.
| Original language | English |
|---|---|
| Article number | 115197 |
| Journal | Materials Characterization |
| Volume | 225 |
| DOIs | |
| State | Published - Jul 2025 |
Keywords
- Crystallization behavior
- Interface diffusion
- Magnetron sputtering
- Mo/BC
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