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Exploring the impact of CH4 gas on crystallization behavior and interfacial structure in Mo/B4C multilayer films: A novel approach to thin-film engineering

  • Junjie Li
  • , Yanyan Yuan*
  • , Jiaoling Zhao
  • , Yuchun Tu
  • , Hu Wang
  • , Yun Cui
  • , Rong Huang
  • , Kui Yi
  • *Corresponding author for this work
  • Jiangsu University of Science and Technology
  • CAS - Shanghai Institute of Optics and Fine Mechanics
  • Shanghai Institute of Laser Plasma
  • University of Chinese Academy of Sciences

Research output: Contribution to journalArticlepeer-review

Abstract

Interface structure and crystallization behavior play an important role in the reflectivity of multilayer mirrors. In this study, Mo/B4C multilayers were prepared by magnetron sputtering technology with the introduction of CH4 gases to investigate crystallization behavior, interface diffusion, as well as interface roughness. The results indicate that the introduction of CH4 gases reduced the crystallinity of the Mo layers to some extent and altered the phase composition. All samples possessed a well-defined periodic structure. The Mo layer was primarily in a microcrystalline or amorphous state, thereby effectively reducing the interface roughness of the multilayer film. Additionally, with the introduction of CH4 gases, an interlayer of molybdenum carbide was formed at the B4C-on-Mo interface, effectively preventing interface diffusion between the layers.

Original languageEnglish
Article number115197
JournalMaterials Characterization
Volume225
DOIs
StatePublished - Jul 2025

Keywords

  • Crystallization behavior
  • Interface diffusion
  • Magnetron sputtering
  • Mo/BC

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