Evolution of electric field amplitude dependent scaling behaviors in ferroelectric films over a broad temperature range

  • J. Yang*
  • , X. J. Meng
  • , M. R. Shen
  • , C. Gao
  • , J. L. Sun
  • , J. H. Chu
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

19 Scopus citations

Abstract

The evolution of the electric field amplitude (V0) dependent scaling of dynamic hysteresis area (A V0α) with the temperature in Mn doped (Pb,Sr) TiO3 film was analyzed. α exhibited different values under three temperature regions, where (1) the intrinsic ferroelectric domain nucleation, growth, and reversal, (2) the competition between the polar nanoregions and mobile defects, and (3) the Joule loss during long range movement of oxygen vacancies were demonstrated. This study provides a quantitative criterion to distinguish the intrinsic ferroelectric hysteresis from artificial one.

Original languageEnglish
Article number092908
JournalApplied Physics Letters
Volume93
Issue number9
DOIs
StatePublished - 2008

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