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Erratum: Absorption spectra of nanocrystalline silicon embedded in SiO 2 matrix (Materials Letters (2000) 42 (367-370))

  • CAS - Institute of Semiconductors
  • CAS - Shanghai Institute of Technical Physics

Research output: Contribution to journalComment/debate

Original languageEnglish
Pages (from-to)299
Number of pages1
JournalMaterials Letters
Volume120
DOIs
StatePublished - 1 Apr 2014
Externally publishedYes

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