Epitaxial integration of a nanoscale BiFeO3 phase boundary with silicon

Wen I. Liang; Chun Yen Peng; Rong Huang; Wei Cheng Kuo; Yen Chin Huang; Carolina Adamo; Yi Chun Chen; Li Chang; Jenh Yih Juang; Darrel G. Schlom; Ying Hao Chu

doi:10.1039/c5nr07033c

Epitaxial integration of a nanoscale BiFeO₃ phase boundary with silicon

Wen I. Liang, Chun Yen Peng, Rong Huang, Wei Cheng Kuo, Yen Chin Huang, Carolina Adamo, Yi Chun Chen, Li Chang, Jenh Yih Juang, Darrel G. Schlom, Ying Hao Chu

School of Physics and Electronic Science

Research output: Contribution to journal › Article › peer-review

8 Scopus citations

Abstract

The successful integration of the strain-driven nanoscale phase boundary of BiFeO₃ onto a silicon substrate is demonstrated with extraordinary ferroelectricity and ferromagnetism. The detailed strain history is delineated through a reciprocal space mapping technique. We have found that a distorted monoclinic phase forms prior to a tetragonal-like phase, a phenomenon which may correlates with the thermal strain induced during the growth process.

Original language	English
Pages (from-to)	1322-1326
Number of pages	5
Journal	Nanoscale
Volume	8
Issue number	3
DOIs	https://doi.org/10.1039/c5nr07033c
State	Published - 21 Jan 2016

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title = "Epitaxial integration of a nanoscale BiFeO3 phase boundary with silicon",

abstract = "The successful integration of the strain-driven nanoscale phase boundary of BiFeO3 onto a silicon substrate is demonstrated with extraordinary ferroelectricity and ferromagnetism. The detailed strain history is delineated through a reciprocal space mapping technique. We have found that a distorted monoclinic phase forms prior to a tetragonal-like phase, a phenomenon which may correlates with the thermal strain induced during the growth process.",

author = "Liang, \{Wen I.\} and Peng, \{Chun Yen\} and Rong Huang and Kuo, \{Wei Cheng\} and Huang, \{Yen Chin\} and Carolina Adamo and Chen, \{Yi Chun\} and Li Chang and Juang, \{Jenh Yih\} and Schlom, \{Darrel G.\} and Chu, \{Ying Hao\}",

note = "Publisher Copyright: {\textcopyright} 2016 The Royal Society of Chemistry.",

year = "2016",

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doi = "10.1039/c5nr07033c",

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T1 - Epitaxial integration of a nanoscale BiFeO3 phase boundary with silicon

AU - Liang, Wen I.

AU - Peng, Chun Yen

AU - Huang, Rong

AU - Kuo, Wei Cheng

AU - Huang, Yen Chin

AU - Adamo, Carolina

AU - Chen, Yi Chun

AU - Chang, Li

AU - Juang, Jenh Yih

AU - Schlom, Darrel G.

AU - Chu, Ying Hao

PY - 2016/1/21

Y1 - 2016/1/21

N2 - The successful integration of the strain-driven nanoscale phase boundary of BiFeO3 onto a silicon substrate is demonstrated with extraordinary ferroelectricity and ferromagnetism. The detailed strain history is delineated through a reciprocal space mapping technique. We have found that a distorted monoclinic phase forms prior to a tetragonal-like phase, a phenomenon which may correlates with the thermal strain induced during the growth process.

AB - The successful integration of the strain-driven nanoscale phase boundary of BiFeO3 onto a silicon substrate is demonstrated with extraordinary ferroelectricity and ferromagnetism. The detailed strain history is delineated through a reciprocal space mapping technique. We have found that a distorted monoclinic phase forms prior to a tetragonal-like phase, a phenomenon which may correlates with the thermal strain induced during the growth process.

UR - https://www.scopus.com/pages/publications/84954124237

U2 - 10.1039/c5nr07033c

DO - 10.1039/c5nr07033c

M3 - 文章

AN - SCOPUS:84954124237

SN - 2040-3364

VL - 8

SP - 1322

EP - 1326

JO - Nanoscale

JF - Nanoscale

IS - 3

ER -

Epitaxial integration of a nanoscale BiFeO₃ phase boundary with silicon

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