Environmentally Controlled Electroluminescence/Photoluminescence Imaging System with Current Density-Voltage Capabilities for Quantitative Degradation Analysis of Perovskite Thin Film Solar Cells

Luminescence-based measurement techniques, such as electroluminescence (EL) and photoluminescence (PL), are great methods to evaluate the quality of solar cell materials and their electric contacts. Furthermore, imaging these responses can provide insights into the spatial character of the samples. In this work, we discuss and demonstrate the ability of our unique EL/PL system equipped with light/dark current density-voltage (JV) measurement capabilities built to observe the degradation mechanism of perovskite minimodules and the small area devices. Here, we report the fabrication of this system including the software capabilities and analysis methods. We briefly demonstrate the capabilities by presenting EL images of perovskite minimodules before and after stressing under constant current conditions. By converting the EL image into a histogram plot we provide a pathway for quantitative analysis of the EL images as a function of degradation time. In addition, we demonstrate EL, PL, and JV degradation as a function of time of four small area perovskite devices measured together at an elevated temperature. We show the acquired EL and PL images and how these and the device efficiency change as a function of time. These examples demonstrate the capability of the system and show that by repeating these measurements at multiple temperatures the degradation mechanisms and activation energies can be investigated.