TY - JOUR
T1 - Enhanced Stability of TaS2 Photodetector by Co Intercalation
AU - Liu, Binglin
AU - Meng, Xianghao
AU - Guo, Jiamin
AU - Wu, Wenbin
AU - Deng, Xing
AU - Ma, Yuanji
AU - Shi, Zeping
AU - Du, Yuhan
AU - Jiang, Xiangyu
AU - Wang, Guangyi
AU - Hao, Congming
AU - Wang, Xinyi
AU - Zhong, Ni
AU - Xiang, Ping Hua
AU - Shen, Hao
AU - Hu, Mengyun
AU - Yuan, Xiang
N1 - Publisher Copyright:
© 2025 The Authors. Published by American Chemical Society.
PY - 2025/2/3
Y1 - 2025/2/3
N2 - Two-dimensional transition-metal dichalcogenides hold great potential for next-generation optoelectronic devices. However, their atomic-scale thickness renders them highly susceptible to molecular adsorption, severely compromising device stability. In this study, we demonstrate a significant enhancement in the stability of the photoelectric response of 2H-TaS2 nanoflakes through cobalt (Co) intercalation. While intrinsic devices exhibit a rapid degradation of 20.5% within hours, the Co-intercalated device shows negligible degradation, demonstrating markedly improved photochemical stability. Remarkably, the photoresponsivity remains at 98.8% of its initial value after two months, projecting an operational lifespan of ∼9.4 years. Moreover, intercalation enhances device performance by more than doubling the responsivity. The intercalated atoms are suggested to prevent the ingress of water and oxygen molecules into the interlayer spaces, thereby enhancing resistance to photochemical reactions and oxidation-induced degradation. This work presents an effective strategy for improving the stability of two-dimensional optoelectronic devices.
AB - Two-dimensional transition-metal dichalcogenides hold great potential for next-generation optoelectronic devices. However, their atomic-scale thickness renders them highly susceptible to molecular adsorption, severely compromising device stability. In this study, we demonstrate a significant enhancement in the stability of the photoelectric response of 2H-TaS2 nanoflakes through cobalt (Co) intercalation. While intrinsic devices exhibit a rapid degradation of 20.5% within hours, the Co-intercalated device shows negligible degradation, demonstrating markedly improved photochemical stability. Remarkably, the photoresponsivity remains at 98.8% of its initial value after two months, projecting an operational lifespan of ∼9.4 years. Moreover, intercalation enhances device performance by more than doubling the responsivity. The intercalated atoms are suggested to prevent the ingress of water and oxygen molecules into the interlayer spaces, thereby enhancing resistance to photochemical reactions and oxidation-induced degradation. This work presents an effective strategy for improving the stability of two-dimensional optoelectronic devices.
UR - https://www.scopus.com/pages/publications/85215605958
U2 - 10.1021/acsmaterialslett.4c01919
DO - 10.1021/acsmaterialslett.4c01919
M3 - 文章
AN - SCOPUS:85215605958
SN - 2639-4979
VL - 7
SP - 627
EP - 635
JO - ACS Materials Letters
JF - ACS Materials Letters
IS - 2
ER -