Abstract
Free-standing antiferroelectric Pb(Zr0.95Ti0.05)O3 (PZT(95/5)) thin film is fabricated on 200-nm-thick Pt foil by using pulsed laser deposition. X-ray diffraction patterns indicate that free-standing PZT(95/5) film possesses an a-axis preferred orientation. The critical electric field for the 300-nm-thick free-standing PZT(95/5) film transiting from antiferroelectric to ferroelectric phases is increased to 770 kV/cm, but its saturation polarization remains almost unchanged as compared with that of the substrate-clamped PZT(95/5) film. The energy storage density and energy efficiency of the substrate-clamped PZT(95/5) film are 6.49 J/cm3 and 54.5%, respectively. In contrast, after removing the substrate, the energy storage density and energy efficiency of the free-standing PZT(95/5) film are enhanced up to 17.45 J/cm3 and 67.9%, respectively.
| Original language | English |
|---|---|
| Article number | 087702 |
| Journal | Chinese Physics B |
| Volume | 25 |
| Issue number | 8 |
| DOIs | |
| State | Published - Aug 2016 |
| Externally published | Yes |
Keywords
- antiferroelectric films
- energy storage
- freestanding