Abstract
Uniform and transparent SrBi2Ta2O9 films were deposited on the quartz glass substrate using the pulsed ArF laser deposition. The ultraviolet-visible optical transmittance of the films indicates that the absorption edge of energy gap is at about 300 nm, and the energy gap is about 3.25 eV using semiconductor theoretical calculation. The Fourier transformation infrared spectrum of the films shows that the lattice vibrational eigen frequency is about 2.4×1013 Hz.
| Original language | English |
|---|---|
| Pages (from-to) | 248-252 |
| Number of pages | 5 |
| Journal | Hongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves |
| Volume | 18 |
| Issue number | 3 |
| State | Published - Jun 1999 |
| Externally published | Yes |