Elemental electrical switch enabling phase segregation–free operation

  • Jiabin Shen
  • , Shujing Jia
  • , Nannan Shi
  • , Qingqin Ge
  • , Tamihiro Gotoh
  • , Shilong Lv
  • , Qi Liu
  • , Richard Dronskowski
  • , Stephen R. Elliott
  • , Zhitang Song*
  • , Min Zhu*
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

122 Scopus citations

Abstract

Nonvolatile phase-change memory has been successfully commercialized, but further density scaling below 10 nanometers requires compositionally and structurally homogeneous materials for both the memory cell and the associated vertically stacked two-terminal access switch. The selector switches are mostly amorphous-chalcogenide Ovonic threshold switches (OTSs), operating with a nonlinear current response above a threshold voltage in the amorphous state. However, they currently suffer from the chemical complexity introduced by the quaternary or even more diverse chalcogenide compositions used. We present a single-element tellurium (Te) volatile switch with a large (≥11 megaamperes per square centimeter) drive current density, ~103 ON/OFF current ratio, and faster than 20 nanosecond switching speed. The low OFF current arises from the existence of a ~0.95–electron volt Schottky barrier at the Te–electrode interface, whereas a transient, voltage pulse–induced crystal-liquid melting transition of the pure Te leads to a high ON current. Our discovery of a single-element electrical switch may help realize denser memory chips.

Original languageEnglish
Pages (from-to)1390-1394
Number of pages5
JournalScience
Volume374
Issue number6573
DOIs
StatePublished - 10 Dec 2021
Externally publishedYes

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