Abstract
Epitaxial SmNiO3-δ thin films were fabricated under various oxygen partial pressures (Po2) on (0 0 1)-oriented LaAlO3 substrates by using the pulsed laser deposition method. Continuous control of the metal-insulator transition temperature (T MI) from 350 K to 85 K was achieved by varying Po2 from 26 Pa to 0.5 Pa. The reduction of T MI can be attributed to the straightening-out of the out-of-plane Ni-O-Ni bond angle due to the elongation of unit cell volume with decreasing Po2. When Po2 > 3 Pa, resistivity anomalies around 200 K are observed in the insulating phase of strained SmNiO3-δ films, suggesting the onset of antiferromagnetic ordering of the Ni sublattices. An electronic phase diagram of the oxygen-deficient SmNiO3-δ films has been established in this work based on the results of the transport measurements.
| Original language | English |
|---|---|
| Article number | 235302 |
| Journal | Journal of Physics D: Applied Physics |
| Volume | 50 |
| Issue number | 23 |
| DOIs | |
| State | Published - 16 May 2017 |
Keywords
- electrical transport
- metal-insulator transition
- nickelate thin film
- oxygen deficiency