Electrolyte-gated SmCoO3 thin-film transistors exhibiting thickness-dependent large switching ratio at room temperature

  • Ping Hua Xiang
  • , Shutaro Asanuma
  • , Hiroyuki Yamada
  • , Hiroshi Sato
  • , Isao H. Inoue
  • , Hiroshi Akoh
  • , Akihito Sawa*
  • , Masashi Kawasaki
  • , Yoshihiro Iwasa
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

26 Scopus citations

Abstract

A Mott transistor that exhibits a large switching ratio of more than two orders at room temperature is demonstrated by using the electric double layer of an ionic liquid for gating on a strongly correlated electron system SmCoO 3. From the thickness dependence of the on-state channel current, we estimate the screening length of the SmCoO3 to be ∼5 nm. The good carrier confinement within the Thomas-Fermi screening length demonstrates that the SmCoO3-channel electric double layer transistor is the first candidate for a two-dimensional Mott transistor.

Original languageEnglish
Pages (from-to)2158-2161
Number of pages4
JournalAdvanced Materials
Volume25
Issue number15
DOIs
StatePublished - 18 Apr 2013

Keywords

  • FET
  • correlated electron oxides
  • metal-insulator transition

Fingerprint

Dive into the research topics of 'Electrolyte-gated SmCoO3 thin-film transistors exhibiting thickness-dependent large switching ratio at room temperature'. Together they form a unique fingerprint.

Cite this