Electrical control of memristance and magnetoresistance in oxide magnetic tunnel junctions

Kun Zhang, Yan Ling Cao, Yue Wen Fang, Qiang Li, Jie Zhang, Chun Gang Duan, Shi Shen Yan, Yu Feng Tian, Rong Huang, Rong Kun Zheng, Shi Shou Kang, Yan Xue Chen, Guo Lei Liu, Liang Mo Mei

Research output: Contribution to journalArticlepeer-review

22 Scopus citations

Abstract

Electric-field control of magnetic and transport properties of magnetic tunnel junctions has promising applications in spintronics. Here, we experimentally demonstrate a reversible electrical manipulation of memristance, magnetoresistance, and exchange bias in Co/CoO-ZnO/Co magnetic tunnel junctions, which enables the realization of four nonvolatile resistance states. Moreover, greatly enhanced tunneling magnetoresistance of 68% was observed due to the enhanced spin polarization of the bottom Co/CoO interface. The ab initio calculations further indicate that the spin polarization of the Co/CoO interface is as high as 73% near the Fermi level and plenty of oxygen vacancies can induce metal-insulator transition of the CoO1-v layer. Thus, the electrical manipulation mechanism on the memristance, magnetoresistance and exchange bias can be attributed to the electric-field-driven migration of oxygen ions/vacancies between very thin CoO and ZnO layers.

Original languageEnglish
Pages (from-to)6334-6339
Number of pages6
JournalNanoscale
Volume7
Issue number14
DOIs
StatePublished - 14 Apr 2015

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