Skip to main navigation Skip to search Skip to main content

Electrical control of memristance and magnetoresistance in oxide magnetic tunnel junctions

  • Kun Zhang
  • , Yan Ling Cao
  • , Yue Wen Fang
  • , Qiang Li
  • , Jie Zhang
  • , Chun Gang Duan
  • , Shi Shen Yan*
  • , Yu Feng Tian
  • , Rong Huang
  • , Rong Kun Zheng
  • , Shi Shou Kang
  • , Yan Xue Chen
  • , Guo Lei Liu
  • , Liang Mo Mei
  • *Corresponding author for this work
  • Shandong University
  • East China Normal University
  • University of Sydney

Research output: Contribution to journalArticlepeer-review

Abstract

Electric-field control of magnetic and transport properties of magnetic tunnel junctions has promising applications in spintronics. Here, we experimentally demonstrate a reversible electrical manipulation of memristance, magnetoresistance, and exchange bias in Co/CoO-ZnO/Co magnetic tunnel junctions, which enables the realization of four nonvolatile resistance states. Moreover, greatly enhanced tunneling magnetoresistance of 68% was observed due to the enhanced spin polarization of the bottom Co/CoO interface. The ab initio calculations further indicate that the spin polarization of the Co/CoO interface is as high as 73% near the Fermi level and plenty of oxygen vacancies can induce metal-insulator transition of the CoO1-v layer. Thus, the electrical manipulation mechanism on the memristance, magnetoresistance and exchange bias can be attributed to the electric-field-driven migration of oxygen ions/vacancies between very thin CoO and ZnO layers.

Original languageEnglish
Pages (from-to)6334-6339
Number of pages6
JournalNanoscale
Volume7
Issue number14
DOIs
StatePublished - 14 Apr 2015

Fingerprint

Dive into the research topics of 'Electrical control of memristance and magnetoresistance in oxide magnetic tunnel junctions'. Together they form a unique fingerprint.

Cite this