Electrical characterization of subbands in the HgCdTe surface layer

  • Y. S. Gui*
  • , G. Z. Zheng
  • , J. H. Chu
  • , S. L. Guo
  • , X. C. Zhang
  • , D. Y. Tang
  • , Yi Cai
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

12 Scopus citations

Abstract

The subband dispersion relations have been computed as a function of the surface electron concentration in the accumulation layers of n-Hg1-xCdxTe photoconductive detectors, while the mobility and concentration for all kinds of carriers in the subband are determined from Shubnikov-de Haas (SdH) oscillation measurements and quantitative mobility spectrum analysis (QMSA). The results show that the QMSA can provide accurate electric parameters for all kinds of carriers in the subband without considering the complex energy band in the semiconductors, while the SdH oscillation can only offer qualitative data because the analysis is based on parabolic energy band approximation.

Original languageEnglish
Pages (from-to)5000-5004
Number of pages5
JournalJournal of Applied Physics
Volume82
Issue number10
DOIs
StatePublished - 15 Nov 1997
Externally publishedYes

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