Efficient techniques for directed test generation using incremental satisfiability

  • Prabhat Mishra*
  • , Mingsong Chen
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

14 Scopus citations

Abstract

Functional validation is a major bottleneck in the current SOC design methodology. While specification-based validation techniques have proposed several promising ideas, the time and resources required for directed test generation can be prohibitively large. This paper presents an efficient test generation methodology using incremental satisfiability. The existing researches have used incremental SAT to improve counterexample (test) generation involving only one property with different bounds. This paper is the first attempt to utilize incremental satisfiability in directed test generation involving multiple properties. The contribution of this paper is a novel methodology to share learning across multiple properties by developing efficient techniques for property clustering, name substitution, and selective forwarding of conflict clauses. Our experimental results using both software and hardware benchmarks demonstrate that our approach can drastically (on average four times) reduce the overall test generation time.

Original languageEnglish
Title of host publicationProceedings
Subtitle of host publication22nd International Conference on VLSI Design - Held Jointly with 7th International Conference on Embedded Systems
Pages65-70
Number of pages6
DOIs
StatePublished - 2009
Externally publishedYes
Event22nd International Conference on VLSI Design - Held Jointly with 7th International Conference on Embedded Systems - New Delhi, India
Duration: 5 Jan 20099 Jan 2009

Publication series

NameProceedings: 22nd International Conference on VLSI Design - Held Jointly with 7th International Conference on Embedded Systems

Conference

Conference22nd International Conference on VLSI Design - Held Jointly with 7th International Conference on Embedded Systems
Country/TerritoryIndia
CityNew Delhi
Period5/01/099/01/09

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