Efficient self-learning techniques for SAT-based test generation

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

SAT-based approaches are promising for automated generation of directed tests. However, due to the state space explosion problem, these methods do not scale well for complex designs. Although various heuristics are proposed to address test generation complexity, most of them require expert knowledge regarding the detailed structure and behavior information of designs explicitly, which limits their usage. This paper proposes promising techniques to derive profitable learnings from the SAT instance itself. The obtained self-learnings can efficiently reduce the chance of long distance backtracks and improve satisfying assignment convergence rate during the SAT search. Experimental results demonstrate that our method can reduce the test generation time by several orders of magnitude.

Original languageEnglish
Title of host publicationCODES+ISSS'12 - Proceedings of the 10th ACM International Conference on Hardware/Software-Codesign and System Synthesis, Co-located with ESWEEK
Pages197-205
Number of pages9
DOIs
StatePublished - 2012
Event10th ACM International Conference on Hardware/Software-Codesign and System Synthesis, CODES+ISSS 2012, Co-located with 8th Embedded Systems Week, ESWEEK 2012 - Tampere, Finland
Duration: 7 Oct 201212 Oct 2012

Publication series

NameCODES+ISSS'12 - Proceedings of the 10th ACM International Conference on Hardware/Software-Codesign and System Synthesis, Co-located with ESWEEK

Conference

Conference10th ACM International Conference on Hardware/Software-Codesign and System Synthesis, CODES+ISSS 2012, Co-located with 8th Embedded Systems Week, ESWEEK 2012
Country/TerritoryFinland
CityTampere
Period7/10/1212/10/12

Keywords

  • Functional validation
  • SAT
  • Test generation

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