TY - GEN
T1 - Efficient Face Image Quality Assessment via Self-Training and Knowledge Distillation
AU - Sun, Wei
AU - Zhang, Weixia
AU - Cao, Linhan
AU - Jia, Jun
AU - Zhu, Xiangyang
AU - Zhu, Dandan
AU - Min, Xiongkuo
AU - Zhai, Guangtao
N1 - Publisher Copyright:
© 2025 IEEE.
PY - 2025
Y1 - 2025
N2 - Face image quality assessment (FIQA) is essential for various face-related applications. Although FIQA has been extensively studied and achieved significant progress, the computational complexity of FIQA algorithms remains a key concern for ensuring scalability and practical deployment in real-world systems. In this paper, we aim to develop a computationally efficient FIQA method that can be easily deployed in real-world applications. Specifically, our method consists of two stages: training a powerful teacher model and distilling a lightweight student model from it. To build a strong teacher model, we adopt a self-training strategy to improve its capacity. We first train the teacher model using labeled face images, then use it to generate pseudo-labels for a set of unlabeled images. These pseudo-labeled samples are used in two ways: (1) to distill knowledge into the student model, and (2) to combine with the original labeled images to further enhance the teacher model through self-training. The enhanced teacher model is used to further pseudo-label another set of unlabeled images for distilling the student models. The student model is trained using a combination of labeled images, pseudo-labeled images from the original teacher model, and pseudo-labeled images from the enhanced teacher model. Experimental results demonstrate that our student model achieves comparable performance to the teacher model with an extremely low computational overhead. Moreover, our method achieved first place in the ICCV 2025 VQualA FIQA Challenge. The code is available at https://github.om/sunwei925/fficient-FIQA.git.
AB - Face image quality assessment (FIQA) is essential for various face-related applications. Although FIQA has been extensively studied and achieved significant progress, the computational complexity of FIQA algorithms remains a key concern for ensuring scalability and practical deployment in real-world systems. In this paper, we aim to develop a computationally efficient FIQA method that can be easily deployed in real-world applications. Specifically, our method consists of two stages: training a powerful teacher model and distilling a lightweight student model from it. To build a strong teacher model, we adopt a self-training strategy to improve its capacity. We first train the teacher model using labeled face images, then use it to generate pseudo-labels for a set of unlabeled images. These pseudo-labeled samples are used in two ways: (1) to distill knowledge into the student model, and (2) to combine with the original labeled images to further enhance the teacher model through self-training. The enhanced teacher model is used to further pseudo-label another set of unlabeled images for distilling the student models. The student model is trained using a combination of labeled images, pseudo-labeled images from the original teacher model, and pseudo-labeled images from the enhanced teacher model. Experimental results demonstrate that our student model achieves comparable performance to the teacher model with an extremely low computational overhead. Moreover, our method achieved first place in the ICCV 2025 VQualA FIQA Challenge. The code is available at https://github.om/sunwei925/fficient-FIQA.git.
KW - Image quality assesment
KW - face image
KW - knowledge distillation
KW - self-training
UR - https://www.scopus.com/pages/publications/105035224692
U2 - 10.1109/ICCVW69036.2025.00356
DO - 10.1109/ICCVW69036.2025.00356
M3 - 会议稿件
AN - SCOPUS:105035224692
T3 - Proceedings - 2025 IEEE/CVF International Conference on Computer Vision Workshops, ICCV-W 2025
SP - 3394
EP - 3402
BT - Proceedings - 2025 IEEE/CVF International Conference on Computer Vision Workshops, ICCV-W 2025
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2025 IEEE/CVF International Conference on Computer Vision Workshops, ICCV-W 2025
Y2 - 19 October 2025 through 20 October 2025
ER -